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Lookup NU author(s): Tomasz Szydlo, Professor Raj Ranjan
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© 1997-2012 IEEE.In the Internet of Things (IoT) context, the landscape of weaknesses in the IoT spectrum sheds light on addressing faults by researchers due to the number of IoT components that unveil immense vulnerabilities to failures. Hence, there is a need to comprehend the faults dynamics to facilitate identifying potential hazards in a developer's design, deliver methodologies to mitigate the risks, and ensure the data quality and resiliency of the IoT's deployment. This article comprehensively aims to analyze faults occurrences in the IoT, their impacts on functionality, and their repercussions on data. It highlights the intricate patterns of data faults by addressing various aspects, such as duration, cause, pitfalls, component, type, and source.
Author(s): Altarrazi S, Szydlo T, Dustdar S, Srirama SN, Ranjan R, Dustdar S
Publication type: Article
Publication status: Published
Journal: IEEE Internet Computing
Year: 2023
Volume: 27
Issue: 6
Pages: 43-51
Online publication date: 17/11/2023
Acceptance date: 02/04/2018
ISSN (print): 1089-7801
ISSN (electronic): 1941-0131
Publisher: Institute of Electrical and Electronics Engineers Inc.
URL: https://doi.org/10.1109/MIC.2023.3300508
DOI: 10.1109/MIC.2023.3300508
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