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Browsing publications by Professor Anthony O'Neill.

Newcastle AuthorsTitleYearFull text
Dr Boubker Zaaimi
Mark Turnbull
Dr Anupam Hazra
Dr Yujiang Wang
Dr Carolina Gandara De Souza
et al.
Closed-loop optogenetic control of normal and pathological network dynamics2022
Dr Stuart Maitland
Dr Enrique Escobedo-Cousin
Dr Ian Schofield
Professor Anthony O'Neill
Professor Stuart Baker
et al.
Electrical cross-sectional imaging of human motor units in vivo2022
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation2022
Dimitrios Firfilionis
Frances Hutchings
Dr Reza Tamadoni Jahromi
Dr Darren Walsh
Mark Turnbull
et al.
A Closed-Loop Optogenetic Platform2021
Dr Guangru Zhang
Dr Dragos Neagu
Dr Peter King
Professor Anthony O'Neill
Professor Ian Metcalfe
et al.
The effects of sulphur poisoning on the microstructure, composition andoxygen transport properties of perovskite membranes coated withnanoscale alumina layers2021
Dr Zi Jie Choong
Dr Dehong Huo
Dr Nilhil Ponon
Rachael Savidis
Professor Patrick Degenaar
et al.
A novel hybrid technique to fabricate silicon-based micro-implants with near defect-free quality for neuroprosthetics application2020
Dimitrios Firfilionis
Dr Wei Xu
Dr Darren Walsh
Dr Enrique Escobedo-Cousin
Dr Reza Ramezani
et al.
The Neural Engine: A Reprogrammable Low Power Platform for Closed-loop Optogenetics2020
Dr Emma Brunton
Dr Enrique Escobedo-Cousin
Dr Gaurav Gupta
Professor Roger Whittaker
Professor Anthony O'Neill
et al.
W:Ti flexible transversal electrode array for peripheral nerve stimulation: A feasibility study2020
Dr Jesus Urresti Ibanez
Dr Sarah Olsen
Professor Nick Wright
Professor Anthony O'Neill
Design and Analysis of High Mobility Enhancement Mode 4H-SiC MOSFETs Using a Thin SiO2 / Al2O3 Gate Stack2019
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Edge chipping minimisation strategy for milling of monocrystalline silicon: A molecular dynamics study2019
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Micro-machinability and edge chipping mechanism studies on diamond micro-milling of monocrystalline silicon2019
Professor Anthony O'Neill
Faiz Arith
Dr Jesus Urresti Ibanez
Dr Konstantin Vasilevskiy
Professor Nick Wright
et al.
High Mobility 4H-SiC MOSFET2018
Faiz Arith
Dr Jesus Urresti Ibanez
Dr Konstantin Vasilevskiy
Dr Sarah Olsen
Professor Nick Wright
et al.
High mobility 4H-SiC MOSFET using a thin SiO2/Al2O3 gate stack2018
Faiz Arith
Dr Jesus Urresti Ibanez
Dr Konstantin Vasilevskiy
Dr Sarah Olsen
Professor Nick Wright
et al.
Increased Mobility in Enhancement Mode 4H-SiC MOSFET Using a Thin SiO2 / Al2O3 Gate Stack2018
Dr Sarah Olsen
Professor Anthony O'Neill
Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures2018
Dr Rolando Berlinguer Palmini
Dr Nilhil Ponon
Professor Anthony O'Neill
Professor Patrick Degenaar
Opto‐electro‐thermal optimization of photonic probes for optogenetic neural stimulation2018
Dr Fahimeh Dehkhoda
Dr Ahmed Abd El-Aal
Dr Nilhil Ponon
Professor Andrew Jackson
Professor Anthony O'Neill
et al.
Self-sensing of temperature rises on light emitting diode based optrodes2018
Sandip Roy
Dr Jesus Urresti Ibanez
Professor Anthony O'Neill
Professor Nick Wright
Dr Alton Horsfall
et al.
Characterisation of 4H-SiC MOS capacitor with a protective coating for harsh environments applications2017
Dr Fahimeh Dehkhoda
Dr Ahmed Abd El-Aal
Dr Nilhil Ponon
Professor Anthony O'Neill
Professor Patrick Degenaar
et al.
LED-Based Temperature Sensor2017
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Micro-machining of monocrystalline silicon with improved edge quality2017
Srinivas Ganti
Dr Peter King
Dr Erhan Arac
Dr Billy Murdoch
Professor Peter Cumpson
et al.
Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge2017
Harbaljit Sohal
Dr Konstantin Vasilevskiy
Professor Andrew Jackson
Professor Stuart Baker
Professor Anthony O'Neill
et al.
Design and Microfabrication Considerations for Reliable Flexible Intracortical Implants2016
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Effect of crystallographic orientation and employment of different cutting tools on micro-end-milling of monocrystalline silicon2016
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Investigation of edge-chipping reduction on silicon micro-milling2016
Harbaljit Sohal
Dr Gavin Clowry
Professor Andrew Jackson
Professor Anthony O'Neill
Professor Stuart Baker
et al.
Mechanical Flexibility Reduces the Foreign Body Response to Long-Term Implanted Microelectrodes in Rabbit Cortex2016
Dr Zi Jie Choong
Dr Dehong Huo
Professor Patrick Degenaar
Professor Anthony O'Neill
Micro-Machinability Studies of Single Crystal Silicon Using Diamond End-Mill2016
Sami Ramadan
Dr Kelvin Kwa
Dr Peter King
Professor Anthony O'Neill
Reliable Fabrication of Sub-10 nm Silicon Nanowires by Optical Lithography2016
Professor Anthony O'Neill
(Invited) Negative Capacitance Using Ferroelectrics for Future Steep-Slope MOSFETS2015
Dr Nilhil Ponon
Dan Appleby
Dr Erhan Arac
Dr Peter King
Srinivas Ganti
et al.
Effect of deposition conditions and post deposition anneal on reactively sputtered titanium nitride thin films2015
Dr Enrique Escobedo-Cousin
Dr Peter King
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Jon Goss
et al.
Electrical Characterization of Epitaxial Graphene Field-Effect Transistors with High-k Al2O3 Gate Dielectric Fabricated on SiC Substrates2015
Dr Toby Hopf
Dr Konstantin Vasilevskiy
Dr Enrique Escobedo-Cousin
Dr Alton Horsfall
Dr Jon Goss
et al.
Facile technique for the removal of metal contamination from graphene2015
Dr Toby Hopf
Dr Konstantin Vasilevskiy
Enrique Escobedo-Cousin
Professor Nick Wright
Dr Alton Horsfall
et al.
Determination of the adhesion energy of graphene on SiC(0001) via measurement of pleat defects2014
Dr Toby Hopf
Dr Konstantin Vasilevskiy
Dr Enrique Escobedo-Cousin
Dr Peter King
Professor Nick Wright
et al.
Dirac point and transconductance of top-gated graphene field-effect transistors operating at elevated temperature2014
Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
Electrical characterisation of highly doped triangular silicon nanowires2014
Dan Appleby
Dr Nilhil Ponon
Dr Kelvin Kwa
Professor Anthony O'Neill
Experimental Observation of Negative Capacitance in Ferroelectrics at Room Temperature2014
Dr Peter King
Dr Erhan Arac
Srinivas Ganti
Sami Ramadan
Dr Kelvin Kwa
et al.
Fermi Level De-pinning In Metal-Semiconductor Contacts Via Nanometre-scale ALD Dielectric Films2014
Dan Appleby
Dr Nilhil Ponon
Dr Kelvin Kwa
Srinivas Ganti
Professor Anthony O'Neill
et al.
Ferroelectric properties in thin film barium titanate grown using pulsed laser deposition2014
Dr Nilhil Ponon
Dan Appleby
Dr Erhan Arac
Dr Kelvin Kwa
Dr Jon Goss
et al.
Impact of Crystalline Orientation on the Switching Field in Barium Titanate Using Piezoresponse Force Spectroscopy2014
Dr Peter King
Dr Erhan Arac
Srinivas Ganti
Dr Kelvin Kwa
Dr Nilhil Ponon
et al.
Improving metal/semiconductor conductivity using AlOx interlayers on n-type and p-type Si2014
Dr Toby Hopf
Dr Konstantin Vasilevskiy
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Dr Alton Horsfall
et al.
Optimizing the vacuum growth of epitaxial graphene on 6H-SiC2014
Dr Enrique Escobedo-Cousin
Dr Toby Hopf
Professor Nick Wright
Professor Anthony O'Neill
Dr Alton Horsfall
et al.
Solid phase growth of graphene on silicon carbide by nickel silicidation: graphene formation mechanisms2014
Dr Enrique Escobedo-Cousin
Dr Konstantin Vasilevskiy
Dr Toby Hopf
Professor Nick Wright
Professor Anthony O'Neill
et al.
Solid Phase Growth of Graphene on Silicon Carbide by Nickel Silicidation: Graphene Formation Mechanisms2014
Harbaljit Sohal
Professor Andrew Jackson
Dr Gavin Clowry
Dr Konstantin Vasilevskiy
Professor Anthony O'Neill
et al.
The sinusoidal probe: a new approach to improve electrode longevity 2014
Professor Anthony O'Neill
Dan Appleby
Dr Nilhil Ponon
Dr Kelvin Kwa
Towards steep slope MOSFETs using ferroelectric negative capacitance2014
Raied Al-Hamadany
Dr Jon Goss
Professor Patrick Briddon
Professor Anthony O'Neill
Dr Mark Rayson
et al.
Impact of tensile strain on the oxygen vacancy migration in SrTiO3: Density functional theory calculations2013
Dr Enrique Escobedo-Cousin
Dr Konstantin Vasilevskiy
Dr Toby Hopf
Professor Nick Wright
Professor Anthony O'Neill
et al.
Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon2013
Dr Enrique Escobedo-Cousin
Dr Toby Hopf
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Jon Goss
et al.
Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation2013
Raied Al-Hamadany
Dr Jon Goss
Professor Patrick Briddon
Meaad Al-Hadidi
Professor Anthony O'Neill
et al.
Oxygen vacancy migration in compressively strained SrTiO32013
Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for triangular silicon nanowire2013
Dr Kelvin Kwa
Dr Jon Goss
Dr Zhiyong Zhou
Dr Nilhil Ponon
Dan Appleby
et al.
A comprehensive study on the leakage current mechanisms of Pt/SrTiO3/Pt capacitor2012
Dr Jon Goss
Dr Kelvin Kwa
Professor Anthony O'Neill
Anomalous resistive switching phenomenon2012
Dr Nilhil Ponon
Dan Appleby
Dr Kelvin Kwa
Professor Anthony O'Neill
Ferroelectrics for nanoelectronics2012
Dr Jon Goss
Dr Kelvin Kwa
Raied Al-Hamadany
Dan Appleby
Dr Nilhil Ponon
et al.
Leakage current asymmetry and resistive switching behavior of SrTiO32012
Dr Enrique Escobedo-Cousin
Dr Konstantin Vasilevskiy
Irina Nikitina
Professor Nick Wright
Professor Anthony O'Neill
et al.
Local Solid Phase Epitaxy of Few-Layer Graphene on Silicon Carbide2012
Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
Top-down fabrication of single crystal silicon nanowire using optical lithography2012
Mouhsine Fjer
Dr Stefan Persson
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Low Frequency Noise in Strained Si Heterojunction Bipolar Transistors2011
Harbaljit Sohal
Professor Andrew Jackson
Robert Jackson
Dr Konstantin Vasilevskiy
Dr Gavin Clowry
et al.
A novel flexible sinusoidal electrode to enhance longevity of chronic neuronal recordings2010
Dr Barry Gallacher
Professor Steve Bull
Dr Alton Horsfall
Professor Anthony O'Neill
Analysis and characterization of a mechanical sensor to monitor stress in interconnect features2010
Rouzet Agaiby
Dr Sarah Olsen
Professor Anthony O'Neill
Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices2010
Layi Alatise
Dr Sarah Olsen
Professor Anthony O'Neill
Improved self-gain in deep submicrometer strained silicon-germanium pMOSFETs with HfSiOx/TiSiN gate stacks2010
Dr Alton Horsfall
Professor Anthony O'Neill
In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/Iow-k damascene interconnects using synchrotron radiation2010
Dr Alton Horsfall
Professor Anthony O'Neill
In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/low-k damascene interconnects using synchrotron radiation2010
Dr Basel Halak
Professor Alex Yakovlev
Professor Anthony O'Neill
Is a single cell sensor possible?2010
Layi Alatise
Dr Sarah Olsen
Professor Anthony O'Neill
Linearity and mobility degradation in strained Si MOSFETs with thin gate dielectrics2010
Dr Stefan Persson
Mouhsine Fjer
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Anthony O'Neill
et al.
Strained-Silicon Heterojunction Bipolar Transistor2010
Layi Alatise
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
The impact of self-heating and SiGe strain-relaxed buffer thickness on the analog performance of strained Si nMOSFETs2010
Professor Anthony O'Neill
X-ray propagation in multiwall carbon nanotubes2010
Liang Yan
Dr Sarah Olsen
Professor Anthony O'Neill
1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack2009
Layi Alatise
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
A design methodology for maximizing the voltage gain of strained Si MOSFETs using the thickness of the silicon-germanium strain relaxed buffer as a design parameter2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
A NEMS-based sensor to monitor stress in deep sub-micron Cu/Low-k interconnects2009
Christopher Wilson
Professor Anthony O'Neill
Dr Alton Horsfall
Application of a Nano-Mechanical Sensor to Monitor Stress in Copper Damascene Interconnects2009
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Anthony O'Neill
Defect identification in strained Si/SiGe heterolayers for device applications2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization2009
Layi Alatise
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
Improved Analog Performance in Strained-Si MOSFETs Using the Thickness of the Silicon-Germanium Strain-Relaxed Buffer as a Design Parameter2009
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Anthony O'Neill
Optimization of the channel lateral strain profile for improved performance of multi-gate MOSFETs2009
Dr Sarah Olsen
Professor Nick Cowern
Professor Anthony O'Neill
Performance Enhancements in Scaled Strained-SiGe pMOSFETs With HfSiOx/TiSiN Gate Stacks2009
Irina Nikitina
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
Phase composition and electrical characteristics of nickel silicide Schottky contacts formed on 4H-SiC2009
Dr Konstantin Vasilevskiy
Irina Nikitina
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
Silicon Carbide Static Induction Transistor with Implanted Buried Gate2009
Dr Sarah Olsen
Liang Yan
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Strained Si/SiGe MOS technology: Improving gate dielectric integrity2009
Dr Alton Horsfall
Professor Anthony O'Neill
Study of the effect of dielectric porosity on the stress in advanced Cu/low-k interconnects using x-ray diffraction2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Synchrotron measurement of the effect of dielectric porosity and air gaps on the stress in advanced Cu/low-k interconnects2009
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Synchrotron measurement of the effect of linewidth scaling on stress in advanced Cu/Low-k interconnects2009
Dr Barry Gallacher
Professor Anthony O'Neill
Professor Steve Bull
Dr Alton Horsfall
Analysis of a passive sensor for predicting process-induced stress in advanced integrated circuit interconnect2008
Professor Anthony O'Neill
Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation2008
Professor David Herbert
Professor Anthony O'Neill
Bragg scattering of x-rays in multiwalled carbon nanotubes2008
Dr Stefan Persson
Mouhsine Fjer
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Anthony O'Neill
et al.
Fabrication and characterisation of strained Si heterojunction bipolar transistors on virtual substrates2008
Layi Alatise
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
Improved Analog Performance of Strained Si n-MOSFETs on Thin SiGe Strained Relaxed Buffers2008
Liang Yan
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Improved gate oxide integrity of strained Si n-channel metal oxide silicon field effect transistors using thin virtual substrates2008
Professor Anthony O'Neill
Dr Alton Horsfall
Influence of barriers on the reliability of dual damascene copper contacts2008
Professor Anthony O'Neill
Dr Sarah Olsen
Insight into the aggravated lifetime reliability in advanced MOSFETs with strained-Si channels on SiGe strain-relaxed buffers due to self-heating2008
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Anthony O'Neill
Investigation of Strain Profile Optimization in gate-all-around suspended silicon nanowire FET2008
Rouzet Agaiby
Dr Sarah Olsen
Dr Piotr Dobrosz
Professor Steve Bull
Professor Anthony O'Neill
et al.
Nanometer Scale Strain Profiling Through Si-SiGe Heterolayers2008
Rouzet Agaiby
Dr Sarah Olsen
Dr Piotr Dobrosz
Professor Steve Bull
Professor Anthony O'Neill
et al.
Nanometer strain profiling through Si/SiGe quantum layers2008
Dr Sarah Olsen
Dr Piotr Dobrosz
Rouzet Agaiby
Dr Yuk Tsang
Layi Alatise
et al.
Nanoscale strain characterisation for ultimate CMOS and beyond2008
Dr Sarah Olsen
Dr Piotr Dobrosz
Rouzet Agaiby
Dr Yuk Tsang
Layi Alatise
et al.
Nanoscale strain characterisation for ultimate CMOS and beyond2008
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Steve Bull
Dr Yuk Tsang
Rouzet Agaiby
et al.
Nanoscale strain characterisation in patterned SSOI structures2008
Irina Nikitina
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC2008
Professor Anthony O'Neill
Dr Yuk Tsang
Dr Barry Gallacher
Dr Sarah Olsen
Piezomobility description of strain-induced mobility2008
Professor Anthony O'Neill
Rouzet Agaiby
Dr Sarah Olsen
Yang Yang
Reduced self-heating by strained silicon substrate engineering2008
Dr Sarah Olsen
John Varzgar
Dr Enrique Escobedo-Cousin
Rouzet Agaiby
Dr Piotr Dobrosz
et al.
Strain engineering for high mobility channels2008
Professor Andrew Houlton
Dr Ben Horrocks
Professor Nick Wright
Dr Sarah Olsen
Professor Anthony O'Neill
et al.
Top down and Bottom-up Routes to Nanoscale Electronic Components2008
Dr Yuk Tsang
Professor Anthony O'Neill
Dr Barry Gallacher
Dr Sarah Olsen
Using piezoresistance model with C-R conversion for modeling of strain-induced mobility2008
Professor Anthony O'Neill
Dr Sarah Olsen
Yang Yang
Rouzet Agaiby
[invited] Engineering Self-Heating by Strained Silicon Technology2007
Dr Alton Horsfall
Professor Anthony O'Neill
Application of CVD-W Diffusion Barrier Layers to Dual Damascene Copper Contacts2007
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Anthony O'Neill
Bended gate-all-around nanowire MOSFET: A device with enhanced carrier mobility due to oxidation-induced tensile stress2007
Dr Alton Horsfall
Professor Steve Bull
Professor Anthony O'Neill
Comparative study of novel barrier layers in ULSI copper interconnects2007
Christopher Wilson
Dr Alton Horsfall
Professor Anthony O'Neill
Professor Nick Wright
Professor Steve Bull
et al.
Direct measurement of electromigration-induced stress in interconnect structures2007
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Yuk Tsang
Dr Piotr Dobrosz
Evolution of strain engineering for Si technology2007
Dr Konstantin Vasilevskiy
Irina Nikitina
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
High voltage silicon carbide schottky diodes with single zone junction termination extension2007
Dr Yuk Tsang
Dr Sanatan Chattopadhyay
Dr Suresh Uppal
Dr Enrique Escobedo-Cousin
Deepak Ramakrishnan
et al.
Modeling of the threshold voltage in strained Si/Si1-x Gex/S1-yGey(x ≥ y) CMOS architectures2007
Rouzet Agaiby
Yang Yang
Dr Sarah Olsen
Professor Anthony O'Neill
Quantifying self-heating effects in strained Si MOSFETs with scaling2007
Rimoon Agaiby
Yang Yang
Dr Sarah Olsen
Professor Anthony O'Neill
Quantifying self-heating effects with scaling in globally strained Si MOSFETs2007
Professor Anthony O'Neill
Dr Sarah Olsen
Yang Yang
Rouzet Agaiby
Reduced self-heating by strained Si substrate engineering2007
Professor Anthony O'Neill
Dr Sarah Olsen
Rimoon Agaiby
Reduced self-heating by strained Si substrate engineering2007
Professor Anthony O'Neill
Dr Sarah Olsen
Yang Yang
Rouzet Agaiby
Reduced Self-Heating by Strained Silicon Substrate Engineering2007
Dr Sarah Olsen
Rouzet Agaiby
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Strained Si/SiGe MOS technology: improving gate dielectric integrity2007
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
Professor Anthony O'Neill
Strained Si/SiGe MOS technology: Improving gate dielectric integrity2007
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Anthony O'Neill
Layi Alatise
Rouzet Agaiby
et al.
Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs2007
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Dr Piotr Dobrosz
Professor Steve Bull
Professor Anthony O'Neill
et al.
Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers2007
Professor David Herbert
Professor Anthony O'Neill
X-ray propagation in carbon nanotubes2007
Liang Yan
Dr Sarah Olsen
Dr Mehdi Kanoun
Rimoon Agaiby
Goutan Dalapati
et al.
Analysis of gate leakage characteristics in strained Si MOSFETs2006
Dr Sarah Olsen
Dr Mehdi Kanoun
Mohamed Al-Areeki
Rimoon Agaiby
Goutan Dalapati
et al.
Analysis of gate leakage in strained Si MOSFETs2006
Liang Yan
Dr Sarah Olsen
Dr Mehdi Kanoun
Rimoon Agaiby
Goutan Dalapati
et al.
Analysis of Gate Leakage in Strained Si MOSFETs2006
Dr Yuk Tsang
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Goutan Dalapati
Rouzet Agaiby
et al.
Analytical model for threshold voltage of p-MOSFET in strained-Si/SiGe dual channel architecture2006
Praneet Bhatnagar
Dr Alton Horsfall
Professor Nick Wright
Dr Christopher Johnson
Dr Konstantin Vasilevskiy
et al.
Analytical modelling of I-V characteristics for 4H-SiC enhancement mode VJFET2006
Professor Anthony O'Neill
Calibration of 4H-SiC TCAD models and material parameters2006
Dr Sanatan Chattopadhyay
John Varzgar
Dr Johan Seger
Dr Yuk Tsang
Dr Kelvin Kwa
et al.
Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices2006
Dr Sanatan Chattopadhyay
John Varzgar
Dr Johan Seger
Dr Yuk Tsang
Dr Kelvin Kwa
et al.
Capacitance-voltage (C-V) technique for the characterisation of strained Si/Si1-xGex hetero-structure MOS devices2006
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
John Varzgar
Rimoon Agaiby
Dr Johan Seger
et al.
Control of self-heating in thin virtual substrate strained Si MOSFETs2006
Dr Konstantin Vasilevskiy
Irina Nikitina
Professor Nick Wright
Dr Alton Horsfall
Professor Anthony O'Neill
et al.
Device processing and characterisation of high temperature silicon carbide Schottky diodes2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
Rimoon Agaiby
Professor Steve Bull
et al.
Device related characterisation techniques for Si/SiGe heterostructures2006
Professor Anthony O'Neill
Device-related characterisation techniques for Si/SiGe heterosructures2006
Dr Alton Horsfall
Professor Anthony O'Neill
Professor Nick Wright
Professor Steve Bull
Direct measurement of electromigration induced stress in interconnect structures2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Yuk Tsang
Dr Piotr Dobrosz
Evolution of strain engineering for Si technology2006
Goutan Dalapati
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Extraction and modelling of strained-Si MOSFET parameters using small signal channel conductance method2006
Goutan Dalapati
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Extraction of strained-Si metal-oxide-semiconductor field-effect transistor parameters using small signal channel conductance method2006
Liang Yan
Dr Sarah Olsen
Dr Mehdi Kanoun
Professor Anthony O'Neill
Gate leakage mechanisms in strained Si devices2006
John Varzgar
Dr Mehdi Kanoun
Dr Suresh Uppal
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.
Gate Oxide Reliability of Strained Si NMOS Devices Employing a Thin SiFe Strain Relaxed Buffer2006
John Varzgar
Dr Sanatan Chattopadhyay
Dr Suresh Uppal
Dr Sarah Olsen
Professor Anthony O'Neill
et al.
Gate oxide reliability of strained Si NMOS devices employing a thin SiGe strain-relaxed buffer2006
Dr Suresh Uppal
John Varzgar
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Professor Anthony O'Neill
et al.
Gate oxide reliability of strained Si/SiGe MOS: effect of Ge content variation2006
Dr Suresh Uppal
John Varzgar
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.
Gate Oxide Reliability on strained Si/SiGe MOS: Effect of Ge content variation2006
Dr Suresh Uppal
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Rimoon Agaiby
Dr Sarah Olsen
et al.
Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices2006
Dr Suresh Uppal
Dr Mehdi Kanoun
Dr Sanatan Chattopadhyay
Rouzet Agaiby
Dr Sarah Olsen
et al.
Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices2006
Dr Konstantin Vasilevskiy
Irina Nikitina
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
High temperature operation of silicon carbide Schottky diodes with recoverable avalanche breakdown2006
Dr Suresh Uppal
Dr Mehdi Kanoun
John Varzgar
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.
Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices2006
Dr Suresh Uppal
Dr Mehdi Kanoun
John Varzgar
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
et al.
Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices2006
Goutan Dalapati
Dr Kelvin Kwa
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
Impact of strained Si thickness and Ge our diffusion on strained-Si/SiO2 interface quality for surface channel strained Si n-MOSFET devices2006
Goutan Dalapati
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Dr Yuk Tsang
et al.
Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs2006
Dr Nebojsa Jankovic Professor
Professor Anthony O'Neill
Modelling of strained-Si/SiGe NMOS transistors including DC self-heating2006
Rimoon Agaiby
Professor Anthony O'Neill
Dr Sarah Olsen
Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling2006
Rimoon Agaiby
Professor Anthony O'Neill
Dr Sarah Olsen
Quantifying self-heating effects in strained Si MOSFETs with scaling2006
Arup Saha
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
Professor Anthony O'Neill
et al.
Quantum-mechanical modeling of current-voltage characteristics of Ti-silicided Schottky diodes2006
John Varzgar
Dr Mehdi Kanoun
Dr Suresh Uppal
Dr Sanatan Chattopadhyay
Dr Yuk Tsang
et al.
Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures2006
John Varzgar
Dr Mehdi Kanoun
Dr Suresh Uppal
Dr Sanatan Chattopadhyay
Dr Yuk Tsang
et al.
Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures2006
Dr Sarah Olsen
Dr Piotr Dobrosz
Dr Enrique Escobedo-Cousin
Rouzet Agaiby
Rimoon Agaiby
et al.
Strain characterisation in advanced Si devices2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
John Varzgar
Rimoon Agaiby
et al.
Strained Si MOSFETs using thin virtual substrates2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
John Varzgar
Rimoon Agaiby
et al.
Strained Si technology2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Strained Si/SiGe MOS technology2006
Professor Anthony O'Neill
Strained Si: Materials, Devices and Processing2006
Professor Anthony O'Neill
Dr Sarah Olsen
Dr Enrique Escobedo-Cousin
John Varzgar
Rouzet Agaiby
et al.
Strained silicon technology2006
Irina Nikitina
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
Structural pattern formation in titanium-nickel contacts on silicon carbide following high-temperature annealing2006
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Steve Bull
Professor Anthony O'Neill
Structuralstability of strained Si layers on thin strain-relaxed buffers for high performance MOSFETs2006
Dr Enrique Escobedo-Cousin
Dr Sarah Olsen
Professor Steve Bull
Professor Anthony O'Neill
Study of surface roughness and dislocation generation in strained Si layers grown on thin strain-relaxed buffers for high performance MOSFETs2006
Dr Sarah Olsen
Dr Piotr Dobrosz
Professor Steve Bull
Professor Anthony O'Neill
The relationship between strain generation and relaxation, composition and electrical performance in strained Si/SiGe MOS technology2006
Goutan Dalapati
Dr Kelvin Kwa
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
Thermal oxidation of strained-Si: impact of strained-Si thickness and Ge on Si/SiO2 interface2006
Dr Sarah Olsen
Professor Steve Bull
Dr Piotr Dobrosz
Dr Enrique Escobedo-Cousin
Rouzet Agaiby
et al.
Thermal stability of thin virtual substrates for high performance devices2006
Dr Sarah Olsen
Professor Anthony O'Neill
A study of SiGe/Si n-MOSFET processed and unprocessed channel layers using FIB and TEM methods2005
Professor Anthony O'Neill
Dr Sarah Olsen
Advancing strained silicon2005
Professor Steve Bull
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Anthony O'Neill
Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy2005
Kai Wang
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
Sorin Soare
et al.
Calibration of MEMS-based test structures for predicting thermomechanical stress in integrated circuit interconnect structures2005
Rimoon Agaiby
Professor Anthony O'Neill
Dr Sarah Olsen
Design considerations for strained Si/SiGe deep submicron dual-channel CMOS using high thermal budgets2005
Dr Sanatan Chattopadhyay
Professor Alex Yakovlev
Professor Satnam Dlay
Professor Anthony O'Neill
Design ofsrained silicon inverters for fture VLSI applications2005
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Doubling speed using strained Si/SiGe CMOS technology2005
Praneet Bhatnagar
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
Dr Konstantin Vasilevskiy
et al.
Effective edge termination design in SiCVJFET2005
Irina Nikitina
Dr Konstantin Vasilevskiy
Professor Nick Wright
Dr Alton Horsfall
Professor Anthony O'Neill
et al.
Formation and role of graphite and nickel silicide in nickel based ohmic contacts to n -type silicon carbide2005
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Goutan Dalapati
et al.
Fowler-Nordheim tunnelling in strained Si/SiGe MOS devices: impact of cross-hatching and nanoscale roughness2005
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si.SiGe n-channel MOSFETs: impact of alloy composition and layer architecture2005
Dr Sarah Olsen
Dr Piotr Dobrosz
Dr Enrique Escobedo-Cousin
Professor Steve Bull
Professor Anthony O'Neill
et al.
Mobility-limiting mechanisms in single and dual channel strained Si/SiGe MOSFETs2005
Rudra Dhar
Goutan Dalapati
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
et al.
Modelling of self-heating in strained Si n-channel MOSFETs on SiGe virtual substrates2005
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation2005
Professor Steve Bull
Dr Piotr Dobrosz
Dr Sarah Olsen
Professor Anthony O'Neill
On the relationship between electrical performance and Raman spectroscopic results for strained Si/SiGe devices2005
Praneet Bhatnagar
Dr Alton Horsfall
Professor Nick Wright
Dr Christopher Johnson
Dr Konstantin Vasilevskiy
et al.
Optimisation of a 4H-SiC enhancement mode power JFET for high temperature operation2005
Chia-Ching Chen
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
Optimisation of heterostructure bipolar transistors in SiC2005
Chia-Ching Chen
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
Optimisation of Heterostructure Bipolar Transistors in SiC2005
Arup Saha
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
Professor Anthony O'Neill
et al.
Prediction of barrier inhomogeneities and carrier transport in Ni-silicided Schottky diode2005
Dr Konstantin Vasilevskiy
Professor Nick Wright
Irina Nikitina
Dr Alton Horsfall
Professor Anthony O'Neill
et al.
Protection of selectively implanted and patterned silicon carbide surfaces with graphite capping layer during post-implantation annealing2005
Dr Sarah Olsen
Professor Anthony O'Neill
Quantitative analysis of gate-oxide interface roughening in SiGe/Si virtual substrate-based transistor device structures2005
Cezar Blasciuc-Dimitriu
Dr Alton Horsfall
Professor Nick Wright
Dr Christopher Johnson
Dr Konstantin Vasilevskiy
et al.
Quantum modelling of I-V characteristics for 4H-SiC Schottky barrier diodes2005
Dr Alton Horsfall
Professor Nick Wright
Sorin Soare
Professor Steve Bull
Professor Anthony O'Neill
et al.
Sensitivity of a rotating beam sensor for stress evaluation in aluminium thin films2005
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
Dr Jie Zhang
et al.
Strained Si/SiGe CMOS: high performance without re-tooling2005
Dr Sarah Olsen
Professor Anthony O'Neill
Strained-Si NMOSFETs on thin 200 nm virtual substrates2005
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Piotr Dobrosz
Professor Steve Bull
Luke Driscoll
et al.
Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors2005
Dr Alton Horsfall
Sorin Soare
Professor Nick Wright
Professor Anthony O'Neill
Professor Steve Bull
et al.
Test chip for the development and evaluation of sensors for measuring stress in metal interconnects2005
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures2005
Dr Nebojsa Jankovic Professor
Professor Anthony O'Neill
2D device-level simulation study of strained-Si pnp heterojunction bipolar transistors on virtual substrates2004
Dr Sarah Olsen
Professor Anthony O'Neill
3D determination of a MOSFET gate morphology by FIB tomography2004
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
Sorin Soare
Professor Steve Bull
et al.
Calibration and optimization of interconnect based MEMS test structures for predicting thermo-mechanical stress in metallization2004
Dr Alton Horsfall
Sorin Soare
Professor Steve Bull
Professor Nick Wright
Professor Anthony O'Neill
et al.
Dependence of process parameters on stress generation in aluminum thin films2004
Dr Sarah Olsen
Dr Kelvin Kwa
Luke Driscoll
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
Design, fabrication and characterisation of strained Si/SiGe MOS transistors2004
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Determination of mechanical parameters for rotating MEMS structures as a function of deposition method2004
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Determination of mechanical parameters for rotating MEMS structures as a function of deposition method2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Evaluation of strained Si/SiGe material for high performance CMOS2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Evaluation of strained Si/SiGe material for high performance CMOS2004
Dr Alton Horsfall
Professor Nick Wright
Dr Christopher Johnson
Dr Konstantin Vasilevskiy
Professor Anthony O'Neill
et al.
First principles derivation of carrier transport across metal - SiC barriers2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Lynn Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Luke Driscoll
Dr Sarah Olsen
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
Dr Kelvin Kwa
et al.
Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters2004
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of Relaxation in Strained Silicon by Grazing Incidence In-plane X-ray Diffraction2004
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of relaxation in strained silicon by grazing incidence in-plane x-ray diffraction2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the Residual Macro and Microstrain in Strained Si/SiGe using Raman Spectroscopy Z Metal2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the residual strain in strained Si/SiGe using Raman spectroscopy2004
Dr Sarah Olsen
Professor Anthony O'Neill
Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures2004
Sorin Soare
Professor Steve Bull
Professor Anthony O'Neill
Professor Nick Wright
Dr Alton Horsfall
et al.
Nanoindentation assessment of aluminium metallisation; the effect of creep and pile-up2004
Dr Sarah Olsen
Professor Anthony O'Neill
Luke Driscoll
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
et al.
Optimization of alloy composition for high-performance strained-Si-SiGe N-channel MOSFETs2004
Dr Nebojsa Jankovic Professor
Professor Anthony O'Neill
Performance evaluation of SiGe heterojunction bipolar transistors on virtual substrates2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Jun Zhang
Si-Based Heterojunctions and Strained Si: Growth, Characterization and Applications2004
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Professor Anthony O'Neill
Strained Si MOSFETs on relaxed SiGe platforms: Performance and challenges2004
Dr Sarah Olsen
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Luke Driscoll
Professor Anthony O'Neill
et al.
Strained Si/SiGe n-channel MISFETs2004
Dr Sarah Olsen
Professor Anthony O'Neill
Strained-Si n-MOS surface-channel and buried Si0.7Ge 0.3 compressively-strained p-MOS fabricated in a 0.25 μm heterostructure CMOS process2004
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Luke Driscoll
Dr Kelvin Kwa
et al.
Study of single- and dual-channel designs for high-performance strained-Si-SiGe n-MOSFETs2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy2004
Dr Piotr Dobrosz
Professor Steve Bull
Dr Sarah Olsen
Professor Anthony O'Neill
Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy2004
Dr Sarah Olsen
Professor Anthony O'Neill
Temperature dependence of submicrometer strained-Si surface channel n-type MOSFETs in DT mode2004
Dr Sarah Olsen
Professor Anthony O'Neill
Temperature sensitivity of DC operation of sub-micron strained-Si MOSFETs2004
Dr Alton Horsfall
Sorin Soare
Professor Nick Wright
Professor Anthony O'Neill
Professor Steve Bull
et al.
Test chip for the development and evaluation of test structures for measuring stress in metal interconnect2004
Dr Sarah Olsen
Professor Anthony O'Neill
Professor Steve Bull
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
et al.
Thermal oxidation of strained Si/SiGe: impact of surface morphology and effect on MOS devices2004
Dr Sarah Olsen
Professor Anthony O'Neill
3D determination of a MOSFET gate morphology by FIB tomography2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Nebojsa Jankovic Professor
Dr Sarah Olsen
Luke Driscoll
et al.
A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics2003
Dr Alton Horsfall
Sorin Soare
Professor Nick Wright
Professor Anthony O'Neill
Professor Steve Bull
et al.
A novel sensor for the direct measurement of process induced residual stress in interconnects2003
Sorin Soare
Professor Steve Bull
Dr Alton Horsfall
Joana Santos
Professor Anthony O'Neill
et al.
Assessment of aluminium thin films by nanindentation2003
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Capacitance - Voltage Characterization of Strained Si/SiGe Multiple Heterojunction Capacitors as a Tool for Heterojunction Metal Oxide Semiconductor Field Effect Transistor Channel Design2003
Cezar Blasciuc-Dimitriu
Dr Alton Horsfall
Dr Konstantin Vasilevskiy
Dr Christopher Johnson
Professor Nick Wright
et al.
Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes2003
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
C-V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design2003
Professor Anthony O'Neill
Dr Sarah Olsen
Design, Fabrication and Characterisation of Strained Si/SiGe MOSFETs2003
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Nicola Wright
et al.
Determination of mechanical parameters for rotatin MEMS as function of deposition method2003
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Determination of mechanical parameters for rotating MEMS as a function of deposition method2003
Sorin Soare
Professor Steve Bull
Dr Adrian Oila
Professor Anthony O'Neill
Professor Nick Wright
et al.
Determination of mechanical parameters for rotating MEMS structures as a function of deposition method2003
Dr Alton Horsfall
Sorin Soare
Professor Nick Wright
Professor Anthony O'Neill
Professor Steve Bull
et al.
Direct measurement of residual stress in sub-micron interconnects2003
Dr Nebojsa Jankovic Professor
Professor Anthony O'Neill
Enhanced performance virtual substrate heterojunction bipolar transistor using strained-Si/SiGe emitter2003
Dr Sarah Olsen
Professor Anthony O'Neill
Gate-oxide interface roughness analyses for oxidation on strained and unstrained vicinal Si surfaces by transmission electron microscopy2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si.SiGe NMOSFETs using a novel CMOS architecture2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si/SiGe n-channel MOSFETs: impact of alloy composition and layer architecture2003
Dr Sarah Olsen
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Professor Anthony O'Neill
et al.
High performance strained Si/SiGe nMOSFETs using a novel CMOS architecture2003
Dr Sarah Olsen
Professor Anthony O'Neill
Luke Driscoll
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
et al.
High-performance nMOSFETs using a novel strained Si/SiGe CMOS architecture2003
Sorin Soare
Dr Alton Horsfall
Professor Steve Bull
Professor Nick Wright
Dr Adrian Oila
et al.
Hinge optimisation in a micro-rotating structure for stress gauging in integrated circuit interconnects2003
Sorin Soare
Professor Steve Bull
Dr Alton Horsfall
Professor Nick Wright
Professor Anthony O'Neill
et al.
Hinge sensitivity in a micro-rotating structure for predicting induced thermo mechanical stress in integrated circuit metal interconnects2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Impact of virtual substrate Ge composition on strained Si MOSFET performance2003
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
Professor Steve Bull
et al.
Impact of Virtual Substrate Ge Composition on Strained Si MOSFET Performance2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Dr Kelvin Kwa
Luke Driscoll
et al.
Impact of virtual substrate growth on high performance strained Si/SiGe double quantum well metal-oxide-semiconductor field-effect transistors2003
Dr Sarah Olsen
Professor Anthony O'Neill
Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs2003
Dr Sarah Olsen
Professor Anthony O'Neill
Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Jie Zhang
Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures2003
Dr Sarah Olsen
Professor Anthony O'Neill
Dr Sanatan Chattopadhyay
Luke Driscoll
Dr Kelvin Kwa
et al.
N-MOSFET performance in single and dual channel strained Si/SiGe CMOS architectures2003
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
Optimisation of a 4H-SiC enhancement mode power JFET2003
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
Optimisation of a 4H-SiC Enhancement Mode Power JFET2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of channel thickness in strained Si/SiGe MOSFETs2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of Channel Thickness in Strained Si/SiGe MOSFETs2003
Dr Kelvin Kwa
Dr Sanatan Chattopadhyay
Dr Sarah Olsen
Luke Driscoll
Professor Anthony O'Neill
et al.
Optimisation of channel thickness in strained Si/SiGe MOSFETs2003
Dr Nebojsa Jankovic Professor
Professor Anthony O'Neill
Performance evaluation of SiGe HBTs on virtual substrates2003
Professor Anthony O'Neill
Propagation of x-rays in carbon nanotubes2003
Professor Anthony O'Neill
Propagation of X-rays in carbon nanotubes2003
Professor Anthony O'Neill
Propagation of x-rays in carbon nanotubes2003
Dr Alton Horsfall
Sorin Soare
Dr Adrian Oila
Professor Steve Bull
Professor Nick Wright
et al.
Residual Stress Sensor for the Microelectronics Industry2003
Professor Anthony O'Neill
Dr Jun Zhang
The relative performance enhancement of strained-Si and buried channel p-MOS as a function of lithographic and effective gate lengths2003
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
et al.
4H-SiC rectifiers with dual metal planar Schottky contacts2002
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
et al.
4H-SiC Schottky diodes with high on/off current ratio2002
Dr Konstantin Vasilevskiy
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
et al.
4H-SiC Schottky diodes with high on/off current ratio2002
Sorin Soare
Professor Steve Bull
Professor Anthony O'Neill
Professor Nick Wright
Assessment of aluminium metallisation by nanoindentation2002
Cezar Blasciuc-Dimitriu
Dr Alton Horsfall
Dr Konstantin Vasilevskiy
Dr Christopher Johnson
Professor Nick Wright
et al.
Characterisation of the high temperature performance of 4H-SiC Schottky barrier diodes2002
Stephen Badcock
Professor Anthony O'Neill
Dr Graeme Chester
Device and circuit performance of SiGe/Si MOSFETs2002
Stephen Badcock
Professor Anthony O'Neill
Dr Graeme Chester
Device and Circuit Performance of SiGe/Si MOSFETs2002
Dr Sarah Olsen
Professor Anthony O'Neill
Professor Steve Bull
Effect of metal-oxide-semiconductor processing on the surface rouhness of strained Si/SiGe material2002
Dr Gordon Phelps
Professor Nick Wright
Dr Graeme Chester
Dr Christopher Johnson
Professor Anthony O'Neill
et al.
Enhanced dopant diffusion effects in 4H silicon carbide2002
Dr Gordon Phelps
Professor Nick Wright
Dr Graeme Chester
Dr Christopher Johnson
Professor Anthony O'Neill
et al.
Enhanced nitrogen diffusion in 4H-SiC2002
Dr Gordon Phelps
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Sylvie Ortolland
et al.
Enhanced nitrogen diffusion in 4H-SiC2002
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the nanoscale roughness of advanced MOSFET layer structures2002
Dr Sarah Olsen
Professor Anthony O'Neill
Measurement of the nanoscale roughness of advanced MOSFET layer structures2002
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
Optimisation of a 4H-SiC enhancement mode power JFET2002
Dr Alton Horsfall
Dr Konstantin Vasilevskiy
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
et al.
Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes2002
Dr Alton Horsfall
Dr Konstantin Vasilevskiy
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
et al.
Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes2002
Dr Gordon Phelps
Professor Nick Wright
Dr Graeme Chester
Dr Christopher Johnson
Professor Anthony O'Neill
et al.
Step bunching fabrication constraints in silicon carbide2002
Dr Sarah Olsen
Professor Anthony O'Neill
Strained Si/SiGe n-channel MOSFETs: Impact of cross-hatching on device performance2002
Dr Alton Horsfall
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
4H-SiC Schottky diodes with high on-off current ratio2001
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Sylvie Ortolland
et al.
Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology2001
Dr Christopher Johnson
Professor Nick Wright
Dominique Morrison
Dr Alton Horsfall
Dr Sylvie Ortolland
et al.
Recent progress and current issues in SiC semiconductor devices for power applications2001
Stephen Badcock
Professor Anthony O'Neill
SiGe HMOSFET differential pair2001
Dominique Morrison
Professor Nick Wright
Dr Alton Horsfall
Dr Christopher Johnson
Professor Anthony O'Neill
et al.
Effect of post-implantation anneal on the electrical characteristics of Ni 4H-SiC Schottky barrier diodes terminated using self-aligned argon ion implantation2000
Dr Mohamad Hossin
Professor Nick Wright
Professor Anthony O'Neill
Evaluation of GaAs Schottky gate bipolar transistor (SGBT) by electrothermal simulation2000
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Sylvie Ortolland
et al.
Implanted bipolar technology in 4H-SiC2000
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Sylvie Ortolland
et al.
Implanted bipolar technology in 4H-SiC2000
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Kazuhiro Adachi
et al.
Implanted bipolar technology in 4H-SiC2000
Dominique Morrison
Professor Nick Wright
Dr Sylvie Ortolland
Dr Christopher Johnson
Professor Anthony O'Neill
et al.
Low temperature annealing of 4H-SiC Schottky diode edge terminations 4 formed by 30 keV Ar+ implantation2000
Stephen Badcock
Professor Anthony O'Neill
Material requirements and design considerations for Si/SiGe heterojunction CMOS2000
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Sylvie Ortolland
et al.
Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology2000
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Alton Horsfall
Dr Sylvie Ortolland
Kazuhiro Adachi
et al.
Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology2000
Dominique Morrison
Dr Christopher Johnson
Professor Nick Wright
Professor Anthony O'Neill
Surface preparation for Schottky metal - 4H-SiC contacts formed on plasma-etched SiC2000
Kazuhiro Adachi
Dr Christopher Johnson
Dr Sylvie Ortolland
Professor Anthony O'Neill
TCAD evaluation of double implanted 4H-SiC power bipolar transistors2000
Dominique Morrison
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes1999
Dominique Morrison
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes1999
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Cell geometry optimisation of 4H-SiC power UMOSFETs by electrothermal simulation1999
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Cell geometry optimisation of 4H-SiC UMOSFETs by electrothernal simulation1999
Professor Anthony O'Neill
Electromigration testing of via terminated test structures1999
Professor Anthony O'Neill
Dr Christopher Johnson
Evaluation of 4H-SiC varactor diodes for microwave applications1999
Dr Christopher Johnson
Professor Anthony O'Neill
Mechanistic model for oxidation of SiC1999
Dr Sylvie Ortolland
Dr Christopher Johnson
Professor Nick Wright
Dominique Morrison
Professor Anthony O'Neill
et al.
Optimisation of a power 4H-SiC SIT device for RF heating applications1999
Dr Sylvie Ortolland
Dr Christopher Johnson
Dominique Morrison
Professor Anthony O'Neill
Optimisation of a power 4H-SiC SIT device for RF heating applications1999
Dr Christopher Johnson
Professor Anthony O'Neill
Oxidation modelling for SiC1999
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Oxidation modelling for SiC1999
Professor Anthony O'Neill
Reliability studies of Cu using wafer level joule heated electromigration test1999
Professor Anthony O'Neill
SiGe virtual substrate N-channel heterojunction MOSFETs1999
Kazuhiro Adachi
Dr Christopher Johnson
Dr Sylvie Ortolland
Professor Nick Wright
Professor Anthony O'Neill
et al.
TCAD evaluation of double implanted 4H-SiC power bipolar transistors1999
Dominique Morrison
Dr Christopher Johnson
Professor Anthony O'Neill
Dr Sylvie Ortolland
The effect of annealing on argon implanted edge terminations for 4H-SiC Schottky diodes1999
Professor Nick Wright
Dr Christopher Johnson
Professor Anthony O'Neill
Sulphur based surface passivation for high voltage GaAS Schottky diodes1998
Professor Steve Bull
Professor Anthony O'Neill
Simple computer modeling of the grain microstructure of Al-4wt%Cu interconnection lines1997