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Metal magnetic memory testing technique for stress measurement

Lookup NU author(s): Professor Gui Yun TianORCiD

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Author(s): Zhu SG, Tian GY, Zhou SQ

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 17th World Conference on Nondestructive Testing

Year of Conference: 2008

Pages: 280-284

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