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Lookup NU author(s): Richard Jones,
Professor Patrick Briddon
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Single-crystalline germanium wafers exposed to hydrogen and/or deuterium plasma are studied by means of Raman scattering. The Raman frequencies are compared to results of ab initio calculations. For samples treated with pure hydrogen, Raman measurements performed at a temperature of 80 K reveal two sharp lines at 3826 and 3834 cm(-1) with an intensity ratio of 3:1, which are assigned to ortho- and para-H-2 trapped at the interstitial T site of the lattice.
Author(s): Hiller M, Lavrov EV, Weber J, Hourahine B, Jones R, Briddon PR
Publication type: Article
Publication status: Published
Journal: Physical Review B
ISSN (print): 1098-0121
ISSN (electronic): 1550-235X
Publisher: American Physical Society
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