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The effect of white-noise mask level on sine-wave contrast threshold and the critical band masking model

Lookup NU author(s): Dr Ignacio Serrano-PedrazaORCiD


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Publication metadata

Author(s): Serrano-Pedraza I, Sierra-Vazquez V

Publication type: Article

Publication status: Published

Journal: Spanish Journal of Psychology

Year: 2006

Volume: 9

Issue: 2

Pages: 249-262

Print publication date: 01/01/2006

ISSN (print): 1138-7416

ISSN (electronic): 2171-6609

Publisher: Universidad Complutense de Madrid, Servicio de Publicaciones