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Monitoring circuit based on threshold for fault-tolerant NoC

Lookup NU author(s): Li Dai, Dr Delong Shang, Dr Fei Xia, Professor Alex Yakovlev


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As CMOS technology continues to scale down, reliability has become one of the most crucial issues in network-on-chip (NoC). A novel NoC monitoring circuit based on fault thresholds is proposed. This circuit is able to distinguish not only transient faults but also non-transient faults in NoC data links and routers with low area and power overhead.

Publication metadata

Author(s): Dai L, Shang D, Xia F, Yakovlev A

Publication type: Letter

Publication status: Published

Journal: Electronics Letters

Year: 2010

Volume: 46

Issue: 14

Pages: 984-985

Print publication date: 08/07/2010

ISSN (print): 0013-5194

ISSN (electronic): 1350-911X


DOI: 10.1049/el.2010.0634