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Lookup NU author(s): Li Dai, Dr Delong Shang, Dr Fei Xia, Professor Alex Yakovlev
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As CMOS technology continues to scale down, reliability has become one of the most crucial issues in network-on-chip (NoC). A novel NoC monitoring circuit based on fault thresholds is proposed. This circuit is able to distinguish not only transient faults but also non-transient faults in NoC data links and routers with low area and power overhead.
Author(s): Dai L, Shang D, Xia F, Yakovlev A
Publication type: Letter
Publication status: Published
Journal: Electronics Letters
Year: 2010
Volume: 46
Issue: 14
Pages: 984-985
Print publication date: 08/07/2010
ISSN (print): 0013-5194
ISSN (electronic): 1350-911X
URL: http://dx.doi.org/10.1049/el.2010.0634
DOI: 10.1049/el.2010.0634
