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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Testability and Test Compaction for Decision Diagram Circuits

Lookup NU author(s): Dr Alex Bystrov

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Publication metadata

Author(s): Bystrov A, Almaini AEA

Publication type: Article

Publication status: Published

Journal: IEE Proceedings - Circuits, Devices and Systems

Year: 1999

Volume: 146

Issue: 4

Pages: 153-158

Print publication date: 01/01/1999

ISSN (print): 1350-2409

Publisher: Institution of Electrical Engineers (IEE)

URL: http://dx.doi.org/10.1049/ip-cds:19990536

DOI: 10.1049/ip-cds:19990536


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