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Probabilistic Evaluation for the Analytical Solution of Large Markov Models: Algorithms and Tool Support

Lookup NU author(s): Professor Aad van Moorsel

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Publication metadata

Author(s): van Moorsel A, Haverkort BR

Publication type: Article

Publication status: Published

Journal: Microelectronics Reliability

Year: 1996

Volume: 36

Issue: 6

Pages: 733-755

Date deposited: 06/12/2011

ISSN (print): 0026-2714

ISSN (electronic): 1872-941X

Publisher: Elsevier

URL: http://dx.doi.org/10.1016/0026-2714(95)00193-X

DOI: 10.1016/0026-2714(95)00193-X

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