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Lookup NU author(s): Professor Cheng Chin
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A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.
Inventor(s): Tan ST, Ong CP, Wong SJ, Chan KA, Chin CS
Publication type: Patent
Publication status: Published
Year: 2008
Pages: 1-8
Print publication date: 01/08/2009
Assignee: Seagate Technology LLC
Country: US
Source Publication Date: 01/08/2009
URL: http://www.freepatentsonline.com/7454980.pdf
