Toggle Main Menu Toggle Search

Open Access padlockePrints

Electronic Device Torsion Testing (7,730,791)

Lookup NU author(s): Professor Cheng Chin

Downloads

Full text is not currently available for this publication.


Publication metadata

Inventor(s): Tan ST, Ong CP, Wong SJ, Chan KA, Chin CS

Publication type: Patent

Publication status: Published

Year: 2010

Pages: 1-8

Print publication date: 08/06/2010

Assignee: Seagate Technology LLC

Country: US

Source Publication Date: 8/6/2010

URL: http://www.freepatentsonline.com/7730791.pdf


Share