Toggle Main Menu Toggle Search

Open Access padlockePrints

Statistical analysis of crosstalk-induced errors for on-chip interconnects

Lookup NU author(s): Dr Basel Halak, Professor Alex Yakovlev


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


The impact of crosstalk noise on the resilience of on-chip communication links in the presence of parametric variations is investigated. A novel metric called crosstalk error rate is developed which can be a valuable tool for designers to predict the crosstalk effects and explore interconnect design techniques in order to achieve the target performance with minimum overheads. Closed-form expressions of crosstalk error rate are presented. This metric is used to compare different crosstalk avoidance methods in the 90 nm technology.

Publication metadata

Author(s): Halak B, Yakovlev A

Publication type: Article

Publication status: Published

Journal: IET Computers and Digital Techniques

Year: 2011

Volume: 5

Issue: 2

Pages: 104-112

Print publication date: 01/03/2011

ISSN (print): 1751-8601

ISSN (electronic): 1751-861X

Publisher: The Institution of Engineering and Technology


DOI: 10.1049/iet-cdt.2009.0054


Altmetrics provided by Altmetric


Funder referenceFunder name