Toggle Main Menu Toggle Search

Open Access padlockePrints

Serrated Yielding in Cu-1%Cd Alloy

Lookup NU author(s): Dr Settivari Nagarjuna, Emeritus Professor Terry Evans


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


The influence of grain size and temperature on the serration patterns of the Portevin-Le Chatelier (PLC) effect and on the yield and flow stresses in a Cu-1 wt-%Cd alloy was investigated in the temperature range 150 to 360 � C. Two kinds of serration patterns were observed in this alloy. Type I occurred at lower temperatures and its yield points are moderately spaced. Type II consists of regular jerky flow observed athigher temperatures. The Hall-Petch equation is obeyed over the temperature range in which jerky flow occurs. The Hall-Petch parameter k (ε) is observed to show a local maximum in the temperature range where serrated flow is first observed. The PLC effect is associated with the solute- dislocation interactions, implying that k (ε) contains a component associated with grain size dependent dislocation storage.

Publication metadata

Author(s): Evans JT; Nagarjuna S; Anozie FN

Publication type: Article

Publication status: Published

Journal: Materials Science and Technology

Year: 2003

Volume: 19

Issue: 12

Pages: 1661-1664

ISSN (print): 0267-0836

ISSN (electronic): 1743-2847

Publisher: Maney Publishing


DOI: 10.1179/026708303225009481


Altmetrics provided by Altmetric