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XPS and AFM characterization of the self-assembled molecular monolayers of a 3-aminopropyltrimethoxysilane on silicon surface, and effects of substrate pretreatment by UV-irradiation

Lookup NU author(s): Dr Chaozong Liu

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Abstract

The self-assembled (SA) molecular monolayers of a 3-aminopropyltrimethoxysilane (3-APTS) on a silicon (111) surface, and the effects of ultraviolet (UV) pre-treatment for substrates on the assembling process have been studied using XPS and atomic force microscopy (AFM). The results show that the SA 3-APTS molecules are bonded to the substrate surface in a nearly vertical orientation, with a thickness of the monolayer of about 0.8–1.5 nm. The SA molecular monolayers show a substantial degree of disorder in molecular packing, which are believed to result from the interactions of amine tails in the silane molecules used with surface functionalities of the substrates, and the oxygen-containing species from the ambient. UV irradiation for silicon substrates prior to the self-assembly reaction can enhance the assembly process and hence, significantly increase the coverage of the monolayer assembled for the substrates

Publication metadata

Author(s): Liu C; Cui N; Yang W

Publication type: Article

Publication status: Published

Journal: Surface and Interface Analysis

Year: 2011

Volume: 43

Issue: 7

Pages: 1082-1088

Print publication date: 06/10/2010

Date deposited: 16/05/2011

ISSN (print): 0142-2421

ISSN (electronic): 1096-9918

Publisher: John Wiley & Sons Ltd.

URL: http://dx.doi.org/10.1002/sia.3698

DOI: 10.1002/sia.3698

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