Browse by author
Lookup NU author(s): Mohammed Alshaikh, Professor David Kinniment, Professor Alex Yakovlev
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
The reliability of a synchronizer depends on its recovery time from metastability, a time which is reduced if the delay through the synchronizer flip flops is large. The D to Q delay in a dual edge triggered D flip flop based on wagging is lower than in other designs allowing more time for metastability recovery. We also apply wagging to the synchronizer itself, reducing its delay even more when compared with conventional cascaded two flip-flops single clock cycle synchronizer, hence increasing the time available for recovery from metastability, and improving its latency. This advantage is greater in multiple cycle synchronizers.
Author(s): Alshaikh M, Kinniment D, Yakovlev A
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: International Conference on Microelectronics (ICM)
Year of Conference: 2010
Pages: 415-418
Publisher: IEEE
URL: http://dx.doi.org/10.1109/ICM.2010.5696176
DOI: 10.1109/ICM.2010.5696176
Library holdings: Search Newcastle University Library for this item
ISBN: 9781612841496
