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Integration of analystic techniques in stochastic optimization of microsystem reliability

Lookup NU author(s): Dr Xiang Xue

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Publication metadata

Author(s): Xue X, Bailey C, Lu H, Stoyanov S

Publication type: Article

Publication status: Published

Journal: Microelectronics Reliability

Year: 2011

Volume: 51

Issue: 5

Pages: 936-945

Print publication date: 12/02/2011

ISSN (print): 0026-2714

ISSN (electronic): 1872-941X

Publisher: Pergamon

URL: http://dx.doi.org/10.1016/j.microrel.2011.01.008

DOI: 10.1016/j.microrel.2011.01.008

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