ePrints

The XIPHOS diffraction facility for extreme sample conditions

Lookup NU author(s): Professor Mike ProbertORCiD, Professor Judith Howard

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Probert MR, Robertson CM, Coome JA, Howard JAK, Michell BC, Goeta AE

Publication type: Article

Publication status: Published

Journal: Journal of Applied Crystallography

Year: 2010

Volume: 43

Issue: 6

Pages: 1415-1418

Print publication date: 01/12/2010

ISSN (print): 0021-8898

ISSN (electronic): 1600-5767

Publisher: Wiley-Blackwell Publishing, Inc.

URL: http://dx.doi.org/10.1107/S0021889810041282

DOI: 10.1107/S0021889810041282

Altmetrics

Share