Toggle Main Menu Toggle Search

Open Access padlockePrints

Electromagnetic Interference in Silicon Carbide DC-DC Converters

Lookup NU author(s): Dr Omid Mostaghimi, Rupert Stevens, Professor Nick Wright, Dr Alton Horsfall


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


A comparison of radiated noise for Silicon and Silicon Carbide converters is presented. SiC JBS diodes were used in this evaluation to enable fast switching times, whilst minimizing the transistor junction temperature. Radiated electromagnetic-interference measurements showed the highest noise signature for the SiC WET and lowest for the SiC MOSFET. The negative gate voltage requirement of the SiC MOSFET introduces up to 6 dB mu V increase in radiated noise, due to the induced current in the high frequency resonant stray loop in the negative power plane of the gate drive. The SiC WET and MOSFET have shown overall converter efficiencies of 96% and 95.5% respectively. This efficiency shows only a weak frequency dependence, in contrast to the CoolMOS-SiC JBS diode combination which demonstrated an efficiency drop from 95% to 92.5% when increasing the frequency from 100kHz to 250kHz.

Publication metadata

Author(s): Mostaghimi O, Stevens RC, Wright NG, Horsfall AB

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 9th European Conference on Silicon Carbide and Related Materials

Year of Conference: 2013

Pages: 1044-1047

Online publication date: 01/01/2013

ISSN: 1662-9752

Publisher: Trans Tech Publications Inc.


DOI: 10.4028/

Library holdings: Search Newcastle University Library for this item

Series Title: Materials Science Forum

ISBN: 9783037856246