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The slope-background for the near-peak regimen of photoemission spectra

Lookup NU author(s): Dr Mariela Bravo Sanchez

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Abstract

Photoemission data typically exhibits a change on the intensity of the background between the two sides of the peaks. This step is usually very well reproduced by the Shirley-Sherwood background. Yet, the change on the slope of the background in the near-peak regime, although usually present, is not always as obvious to the eye. However, the intensity of the background signal associated with the evolution of its slope can be appreciable. The slope-background is designed to empirically reproduce the change on the slope. Resembling the non-iterative Shirley method, the proposed functional form relates the slope of the background to the integrated signal at higher electron kinetic energies. This form can be predicted under Tougaard-Sigmund's electron transport theory in the near-peak regime. To reproduce both the step and slope changes on the background, it is necessary to employ the slope-background in conjunction with the Shirley-Sherwood background under the active-background method. As it is shown for a series of materials, the application of the slope-background provides excellent fits, is transparent to the operator, and is much more independent of the fitting range than other background methods. The total area assessed through the combination of the slope and the Shirley-Sherwood backgrounds is larger than when only the Shirley-Sherwood background is employed, and smaller than when the Tougaard background is employed.


Publication metadata

Author(s): Herrera-Gomez A, Bravo-Sanchez M, Aguirre-Tostado FS, Vazquez-Lepe MO

Publication type: Article

Publication status: Published

Journal: Journal of Electron Spectroscopy and Related Phenomena

Year: 2013

Volume: 189

Pages: 76-80

Online publication date: 09/08/2013

Acceptance date: 21/07/2013

ISSN (print): 0368-2048

ISSN (electronic): 1873-2526

Publisher: Elsevier

URL: http://www.sciencedirect.com/science/article/pii/S0368204813001278

DOI: 10.1016/j.elspec.2013.07.006


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