Toggle Main Menu Toggle Search

Open Access padlockePrints

Pulsed eddy current system for dynamic inspection of defects

Lookup NU author(s): Professor Gui Yun TianORCiD

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Publication metadata

Author(s): Tian GY, Sophian A, Taylor D, Rudlin JR

Publication type: Article

Publication status: Published

Journal: Insight

Year: 2004

Volume: 46

Issue: 5

Pages: 256-260

ISSN (print): 1354-2575

ISSN (electronic): 1754-4904

Publisher: British Institute of Non-Destructive Testing

URL: http://dx.doi.org/10.1784/insi.46.5.256.55559

DOI: 10.1784/insi.46.5.256.55559


Altmetrics

Altmetrics provided by Altmetric


Share