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Lookup NU author(s): Professor Gui Yun TianORCiD
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This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.
Author(s): Tian GY, Lu RS, Gledhill D
Publication type: Article
Publication status: Published
Journal: Optics and Lasers in Engineering
ISSN (print): 0143-8166
ISSN (electronic): 1873-0302
Publisher: Elsevier Ltd
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