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Surface Measurement Using Active Vision and Light Scattering

Lookup NU author(s): Professor Gui Yun TianORCiD

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Abstract

This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.

Publication metadata

Author(s): Tian GY, Lu RS, Gledhill D

Publication type: Article

Publication status: Published

Journal: Optics and Lasers in Engineering

Year: 2007

Volume: 45

Issue: 1

Pages: 131-139

ISSN (print): 0143-8166

ISSN (electronic): 1873-0302

Publisher: Elsevier Ltd

URL: http://dx.doi.org/10.1016/j.optlaseng.2006.03.005

DOI: 10.1016/j.optlaseng.2006.03.005

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