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Lifetime Reliability Analysis of Complementary Resistive Switches under Threshold and Doping Interface Speed Variations

Lookup NU author(s): Professor Rishad Shafik

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Author(s): Gang L, Mathew J, Shafik RA, Pradhan DK, Ottavi M, Pontarelli S

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Nanotechnology

Year: 2015

Volume: 14

Issue: 1

Pages: 130-139

Print publication date: 01/01/2015

Online publication date: 20/11/2014

Acceptance date: 07/11/2014

ISSN (print): 1536-125X

ISSN (electronic): 1941-0085

Publisher: Institute of Electrical and Electronics Engineers

URL: http://dx.doi.org/10.1109/TNANO.2014.2371928

DOI: 10.1109/TNANO.2014.2371928

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