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A Low-Cost Unified Design Methodology for Secure Test and Intellectual Property Core Protection

Lookup NU author(s): Professor Rishad Shafik

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Author(s): Shafik RA, Mathew J, Pradhan DK

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Reliability

Year: 2015

Volume: 64

Issue: 4

Pages: 1243-1253

Print publication date: 01/12/2015

Online publication date: 14/08/2015

Acceptance date: 12/06/2015

ISSN (print): 0018-9529

ISSN (electronic): 1558-1721

Publisher: Institute of Electrical and Electronics Engineers

URL: http://dx.doi.org/10.1109/TR.2015.2464011

DOI: 10.1109/TR.2015.2464011

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