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Dual EMAT and PEC non-contact probe: applications to defect testing

Lookup NU author(s): Professor Gui Yun TianORCiD

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Publication metadata

Author(s): Edwards RS, Sophian A, Dixon S, Tian GY, Jian X

Publication type: Article

Publication status: Published

Journal: NDT & E International

Year: 2006

Volume: 39

Issue: 1

Pages: 45-52

ISSN (print): 0963-8695

ISSN (electronic): 1879-1174

Publisher: Elsevier

URL: http://dx.doi.org/10.1016/j.ndteint.2005.06.001

DOI: 10.1016/j.ndteint.2005.06.001

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