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Robust Iris Segmentation Method Based on a New Active Contour Force with a Noncircular Normalization

Lookup NU author(s): Mohammed Abdullah, Emeritus Professor Satnam Dlay, Dr Wai Lok Woo, Professor Jonathon Chambers



This is the authors' accepted manuscript of an article that has been published in its final definitive form by IEEE, 2017.

For re-use rights please refer to the publisher's terms and conditions.


Traditional iris segmentation methods give good results when the iris images are taken under ideal imaging conditions. However, the segmentation accuracy of an iris recognition system significantly influences its performance especially in nonideal iris images. This paper proposes a novel segmentation method for nonideal iris images. Two algorithms are proposed for pupil segmentation in iris images which are captured under visible and near infrared light. Then, a fusion of an expanding and a shrinking active contour is developed for iris segmentation by integrating a new pressure force to the active contour model. Thereafter, a noncircular iris normalization scheme is adopted to effectively unwrap the segmented iris. In addition, a novel method for closed eye detection is proposed. The proposed scheme is robust in finding the exact iris boundary and isolating the eyelids of the iris images. Experimental results on CASIA V4.0, MMU2, UBIRIS V1, and UBIRIS V2 iris databases indicate a high level of accuracy using the proposed technique. Moreover, the comparison results with the state-of-the-art iris segmentation algorithms revealed considerable improvement in segmentation accuracy and recognition performance while being computationally more efficient.

Publication metadata

Author(s): Abdullah M, Dlay SS, Woo WL, Chambers JA

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Systems, Man, and Cybernetics: Systems

Year: 2017

Volume: 47

Issue: 12

Pages: 3128-3141

Print publication date: 01/12/2017

Online publication date: 19/05/2016

Acceptance date: 05/04/2016

Date deposited: 04/07/2016

ISSN (print): 2168-2216

ISSN (electronic): 2168-2232

Publisher: IEEE


DOI: 10.1109/TSMC.2016.2562500


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