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Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

Lookup NU author(s): Professor Gui Yun TianORCiD

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Publication metadata

Author(s): Tian GY, Sophian A, Taylor D, Rudlin J

Publication type: Article

Publication status: Published

Journal: IET Science, Measurement and Technology

Year: 2005

Volume: 152

Issue: 4

Pages: 141-148

ISSN (print): 1751-8822

ISSN (electronic): 1751-8830

Publisher: The Institution of Engineering and Technology

URL: http://dx.doi.org/10.1049/ip-smt:20045011

DOI: 10.1049/ip-smt:20045011

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