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Strain and Ge concentration determinations in SiGe/Si multiple quantum wells by transmission electron microscopy methods

Lookup NU author(s): Dr David Robbins

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Publication metadata

Author(s): Benedetti A, Norris DJ, Hetherington CJD, Cullis AG, Robbins DJ, Wallis DJ

Publication type: Article

Publication status: Published

Journal: Journal of Applied Physics

Year: 2003

Volume: 93

Issue: 7

Pages: 3893-3899

ISSN (print): 1089-7550

ISSN (electronic): 1520-8850

Publisher: American Institute of Physics

URL: http://dx.doi.org/10.1063/1.1558993

DOI: 10.1063/1.1558993

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