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Quantitative Surface Crack Evaluation Based on Eddy Current Pulsed Thermography

Lookup NU author(s): Dr Wai Lok Woo, Professor Gui Yun TianORCiD


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Eddy current pulsed thermography (ECPT) is an emerging non-destructive testing technology and has an increasing span of application with capabilities of rapid contactless and large surface area detection. The close process loop of ECPT that contains pre-processing, post-processing, and objective quantitative assessment is rarely presented. This paper proposed a complete strategy aims to perform pre- and post-processing for surface crack detection based on ECPT platform. In addition, the quantitative evaluation is involved to objectively evaluate detectability. Specially, a new post-image segmentation algorithm is proposed which based on the idea of grouping histogram and iterative adaption approach that leads to better performance for quantitatively identifying and sizing the defect. Experimental tests on man-made metal and natural defects have been conducted to show the reliability of the proposed strategy. This paper can be further applied for other types of defects detection, quantitative evaluation, and aid in the development of machine vision industry for automated visual inspection.

Publication metadata

Author(s): Li XQ, Gao B, Woo WL, Tian GY, Qiu XS, Gu LY

Publication type: Article

Publication status: Published

Journal: IEEE Sensors Journal

Year: 2017

Volume: 17

Issue: 2

Pages: 412-421

Print publication date: 15/01/2017

Online publication date: 07/11/2016

Acceptance date: 03/11/2016

ISSN (print): 1530-437X

ISSN (electronic): 1558-1748

Publisher: IEEE


DOI: 10.1109/JSEN.2016.2625815


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Funder referenceFunder name
136413China Postdoctoral Science Foundation
269202FP7 HEMOW IRSES Project
51377015National Natural Science Foundation of China
2016GZ0185Science and Technology Department of Sichuan Province, China
61401071National Natural Science Foundation of China
61527803National Natural Science Foundation of China
ZYGX2014J068Fundamental Research Funds for the Central Universities