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Prethreshold Voltage as a Low-Component Count Temperature Sensitive Electrical Parameter without Self-Heating

Lookup NU author(s): Richard Mandeya, Cuili Chen, Professor Volker Pickert, Dr Naayagi Ramasamy



This is the authors' accepted manuscript of a letter published in its final definitive form in 2018. For re-use rights please refer to the publishers terms and conditions.


Temperature Sensitive Electrical Parameters (TSEPs) are promising for measurement of the IGBT chip temperature, Tchip. Many TSEPs have been proposed in the literature and most require current sensors, and convoluted hardware and data processing, which are associated with increased complexity and cost. In this letter, a new TSEP is proposed called pre-threshold TSEP, VGE(pre-th). VGE(pre-th) requires only a voltage sensor and a counter. Besides less hardware requirement, VGE(pre-th) does not suffer from self-heating – a problem that most TSEPs encounter. This letter presents the operation of VGE(pre-th) with the help of simulation. Experimental tests on a 3.3kV, 800A IGBT were conducted to characterize VGE(pre-th). It is shown that the new TSEP proposed has a sensitivity of -2.2mV/°C.

Publication metadata

Author(s): Mandeya R, Chen C, Pickert V, Naayagi RT

Publication type: Letter

Publication status: Published

Journal: IEEE Transactions on Power Electronics

Year: 2018

Volume: 33

Issue: 4

Pages: 2787-2791

Print publication date: 01/04/2018

Online publication date: 04/09/2017

Acceptance date: 20/08/2017

ISSN (print): 0885-8993

ISSN (electronic): 1941-0107


DOI: 10.1109/TPEL.2017.2749179