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IQ signal based RFID sensors for defect detection and characterisation

Lookup NU author(s): Aobo Zhao, Professor Gui Yun Tian, Dr Jun Zhang

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This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License (CC BY-NC-ND).


Abstract

© 2017Radio frequency identification (RFID) sensor systems have unique advantages of identification, communication and sensing together. Previous researches on RFID based sensing investigate power based features, and face the challenges of low sensitivity and robustness due to environment RF field. In this paper, rather than using received signal strength indicator (RSSI), we present a method using features of transient responses from in-phase quadrature (IQ) signal to overcome the challenges of sensitivity and robustness in ultra-high frequency (UHF) RFID sensor systems. The transient responses of the IQ signal are analysed using skewness feature for different defects. The experimental results show that IQ based skewness features from IQ signal improve sensitivity and robustness for defect characterisation compared with previous RSSI and RCS methods.


Publication metadata

Author(s): Zhao A, Tian GY, Zhang J

Publication type: Article

Publication status: Published

Journal: Sensors and Actuators A: Physical

Year: 2018

Volume: 269

Pages: 14-21

Print publication date: 01/01/2018

Online publication date: 07/11/2017

Acceptance date: 06/11/2017

Date deposited: 17/01/2018

ISSN (print): 0924-4247

ISSN (electronic): 1873-3069

Publisher: Elsevier BV

URL: https://doi.org/10.1016/j.sna.2017.11.008

DOI: 10.1016/j.sna.2017.11.008


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