Browse by author
Lookup NU author(s): Professor Bin Gao,
Dr Wai Lok Woo
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
IEEE With the increasing importance of using carbon fiber reinforced polymer (CFRP) composite in the aircraft industry, it becomes ever more critical to monitor the quality and health of CFRP during the manufacturing process as well as the in-service procedure. Most common types of defects in the CFRP are debonds and delaminations. It is difficult to detect the inner defects on a complex shaped specimen by using conventional Nondestructive Testing (NDT) methods. In this paper, an unsupervised machine learning method based on wavelet integrated alternating sparse dictionary matrix decomposition (WIASDMD) is proposed to extract the weaker and deeper defects information for CFRP by using the optical pulse thermography (OPT) system. We propose to model the low rank and sparse decomposition jointly in an alternating manner. By incorporating the low rank information into the sparse matrix and vice versa, the weaker defects will be more efficiently extracted from noise and background. In addition, the integrated of wavelet analysis with dictionary factorization enables an efficient time-frequency mining of information and significantly removes the high frequency noise as well as boosts the speed of computations. To investigate the efficacy and robustness of the proposed method, experimental studies have been carried out for inner debond defects on both regular and irregular shaped CFRP specimens. A comparative analysis has also been undertaken to study the proposed method against the general OPT nondestructive testing (OPTNDT) methods.
Author(s): Ahmed J, Gao B, Woo WL
Publication type: Article
Publication status: Published
Journal: IEEE Transactions on Industrial Informatics
Print publication date: 01/07/2019
Online publication date: 16/11/2018
Acceptance date: 11/11/2018
ISSN (print): 1551-3203
ISSN (electronic): 1941-0050
Altmetrics provided by Altmetric