Electrostatic induction thermography

Zhao, J; Gao, B; Qiu, F; Feng, Q; Lu, P; Tian, GY

doi:10.1109/FENDT.2017.8584611

Electrostatic induction thermography

Lookup NU author(s): Professor Bin Gao, Professor Gui Yun Tian ORCiD

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Abstract

© 2017 IEEE. At the request of the industrial development, induction thermography has emerged as a new nondestructive testing method for surface and subsurface defect detection. However, there exists several problems such as the requirements of excessive excitation power and the limited detection depth. This paper presents a new electrostatic induction thermography NDT method, which can effectively reduce the excitation power and improve the detection depth. Electrostatic induction thermography is based on electrostatic induction effect while using voltage with both positive and negative step to excite and induce current in sample. The sample will be heated up by the induction current and the defect information will be visualized by analysing the thermal pattern. This study investigates excitation source, detection effect and heating depth. In addition, the contrast experiment between pulsed eddy thermography and electrostatic induction thermography has been conducted. It confirms the validity and advantage of the electrostatic induction thermography.