Toggle Main Menu Toggle Search

Open Access padlockePrints

Quantum jump metrology

Lookup NU author(s): Dr Lewis Clark, Dr Adam Stokes

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Abstract

© 2019 American Physical Society. Quantum metrology exploits quantum correlations in specially prepared entangled or other nonclassical states to perform measurements that exceed the standard quantum limit. Typically, though, such states are hard to engineer, particularly when larger numbers of resources are desired. As an alternative, this paper aims to establish quantum jump metrology, which is based on generalized sequential measurements as a general design principle for quantum metrology and discusses how to exploit open quantum systems to obtain a quantum enhancement. By analyzing a simple toy model, we illustrate that parameter-dependent quantum feedback can indeed be used to exceed the standard quantum limit without the need for complex state preparation.


Publication metadata

Author(s): Clark LA, Stokes A, Beige A

Publication type: Article

Publication status: Published

Journal: Physical Review A

Year: 2019

Volume: 99

Issue: 2

Online publication date: 04/02/2019

Acceptance date: 02/04/2016

ISSN (print): 2469-9926

ISSN (electronic): 2469-9934

Publisher: American Physical Society

URL: https://doi.org/10.1103/PhysRevA.99.022102

DOI: 10.1103/PhysRevA.99.022102


Altmetrics

Altmetrics provided by Altmetric


Share