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Research on classification and influencing factors of metro commuting patterns by combining smart card data and household travel survey data

Lookup NU author(s): Dr Amy Guo


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© The Institution of Engineering and Technology 2019.Smart card data (SCD) provide a new perspective for analysing the long-term spatiotemporal travel characteristics of public transit users. Understanding the commuting patterns provides useful insights for urban traffic management. This study attempts to identify and cluster commuting patterns and explore the influencing factors by combining SCD and traditional household travel survey data (HTSD) in Nanjing, China. First, the authors generate the commuting regularity rules using oneday HTSD. Then, the regular metro commuters are identified in four-week (20-weekday) SCD. Using the clustering method of the Gaussian mixture model, they classify metro commuters in SCD into three commuting pattern groups, namely, classic pattern, off-peak pattern, and long-distance pattern, based on their spatiotemporal characteristics. Next, they identify the corresponding metro commuters of these three groups in HTSD and apply a mixed logit regression model to determine the factors influencing metro commuting patterns from multiple dimensions. The results show that some socioeconomic attributes (e.g. gender, age, annual income, education, and occupation) as well as bus station density, metro lines, transfer mode, and transfer distance significantly impact commuting patterns. The findings can provide valuable information for planners and managers to put forward relevant transport guiding measures for alleviating traffic congestion and improving urban traffic management.

Publication metadata

Author(s): Ji Y, Cao Y, Liu Y, Guo W, Gao L

Publication type: Article

Publication status: Published

Journal: IET Intelligent Transport Systems

Year: 2019

Volume: 13

Issue: 10

Pages: 1525-1532

Print publication date: 01/10/2019

Online publication date: 17/07/2019

Acceptance date: 19/06/2019

ISSN (print): 1751-956X

ISSN (electronic): 1751-9578

Publisher: IET


DOI: 10.1049/iet-its.2018.5512


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