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Modelling Reversion Loss and Shoot-through Current in Switched-Capacitor DC-DC Converters with Petri Nets

Lookup NU author(s): Dr Fei Xia, Professor Alex Yakovlev



This is the authors' accepted manuscript of a conference proceedings (inc. abstract) that has been published in its final definitive form by IEEE, 2019.

For re-use rights please refer to the publisher's terms and conditions.


For a Switched-Capacitor DC-DC converter (SCC) in a low power design, reversion losses and shoot-through currents may lead to substantial efficiency degradations and voltage reductions at the output. These reversion losses and shoot-through currents are caused by undesired conduction in MOS devices under certain combinations of internal SCC signals including clocks. This paper proposes a new method that models reversion losses and shoot-through currents in SCCs with Petri nets, providing a formal way of tracking them. With reachability analysis on the Petri Net models, reversion losses and shootthrough currents can be verified and investigated, which is helpful for avoiding these problems in designs. This paper takes cross-coupled voltage doublers as examples. Analysis examples where these properties are identified are presented, together with the finding of healthy traces, which do not contain them. Besides tool-supported reachability analysis capabilities, the natural causal event traceability of Petri net models allows the design of SCCs and other analog and mixed signal (AMS) circuits to be more transparent and understandable, and hence easier to reason about, debug and validate.

Publication metadata

Author(s): Li D, Xia F, Luo J, Yakovlev A

Editor(s): Marisa Lopez-Vallejo and Ruzica Jevtic

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 29th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2019)

Year of Conference: 2019

Online publication date: 10/10/2019

Acceptance date: 06/05/2019

Date deposited: 23/10/2019

ISSN: 2643-3222

Publisher: IEEE


DOI: 10.1109/PATMOS.2019.8862124