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Lookup NU author(s): Dr Graham Purvis,
Dr Cees van der Land,
Dr Elisa Lopez-Capel,
Professor Neil Gray
This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).
What follows is a method applicable generically to the analysis of low levels of organic matter that is embedded in either loose fine-grained or solid geological material. Initially, the range of organic compounds that could be detected in a geological sample using conventional pyrolysis chromatography/mass spectrometry was compared to the range that was detected using thermally assisted hydrolysis and methylation-gas chromatography/mass spectrometry (THM-GC/MS). This method was used to validate the synthetic components fitted to X-ray photoelectron spectroscopy (XPS) carbon spectra of the sample. Reciprocally, XPS analysis was able to identify the constituent carbon-carbon, carbon-oxygen and carbon nitrogen bonds of the functional groups in the compounds identified by THM-GC/MS. The two independently derived outputs from the THM-GC/MS and the XPS techniques mutually validated the identification of organic compounds in our geological samples.
Author(s): Purvis G, Sano N, van der Land C, Barlow A, Lopez-Capel E, Cumpson P, Hood J, Sheriff J, Gray N
Publication type: Article
Publication status: Published
Online publication date: 02/11/2019
Acceptance date: 29/11/2018
Date deposited: 22/11/2019
ISSN (electronic): 2215-0161
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