Browse by author
Lookup NU author(s): Dr Yating Yu, Professor Gui Yun TianORCiD, Qiuji Yi
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
© 2019 Journal of Mechanical Engineering.Non-destructive Testing (NDT) and Structural Health Monitoring (SHM) are important technologies well used in industrial production for ensuring safety and reducing cost. In the field of SHM, the long-term stability of in situ measuring instrument is particularly important. The application of thickness measurement using electromagnetic and ultrasonic non-destructive testing respectively is introduced, then the challenges existing in maintaining the long term stability of thickness non-destructive testing is analysed. In order to explore the accuracy variation of the instruments in the process of long-term use measurement, data are obtained by using three thickness measuring instruments to detect pre-calibrated samples for a five-year term. The long-term stability of eddy current and ultrasonic thickness gauge is discussed by analysing the annual mean error, relative error and change rate of them. It shows that the electromagnetic thickness measuring instrument has a better long-term stability, the accuracy of ultrasonic thickness measuring instrument changed over time, and the accuracy of floor thickness measuring instrument tends to be unstable, which lays a foundation for the application of electromagnetic non-destructive testing technology in SHM for self-calibration and compensation.
Author(s): Gong R, Luo S, Ye B, Yu Y, Tian G, Yi Q
Publication type: Article
Publication status: Published
Journal: Jixie Gongcheng Xuebao/Journal of Mechanical Engineering
Year: 2019
Volume: 55
Issue: 21
Pages: 161-169
Print publication date: 05/11/2019
Acceptance date: 02/04/2018
ISSN (print): 0577-6686
Publisher: Editorial Office of Chinese Journal of Mechanical Engineering
URL: https://doi.org/10.3901/JME.2019.21.161
DOI: 10.3901/JME.2019.21.161
Altmetrics provided by Altmetric