Browse by author
Lookup NU author(s): Dr Aleksey KozikovORCiD
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Vertically stacked van der Waals heterostructures are a lucrative platform for exploring the rich electronic and optoelectronic phenomena in two-dimensional materials. Their performance will be strongly affected by impurities and defects at the interfaces. Here we present the firstsystematic study of interfaces in van der Waals heterostructure using cross sectional scanning transmission electron microscope (STEM) imaging. By measuring interlayer separations and comparing these to density functional theory (DFT) calculations we find that pristine interfaces exist between hBN and MoS2 or WS2 for stacks prepared by mechanical exfoliation in air. However, for two technologically important transition metal dichalcogenide (TMDC) systems, MoSe2 and WSe2 , our measurement of interlayer separations provide the first evidence for impurity species being trapped at buried interfaces with hBN: interfaces which are flat at the nanometer length scale. While decreasing the thickness of encapsulated WSe2 from bulk to monolayer we see a systematic increase in the interlayer separation. We attribute these differences to the thinnest TMDC flakes being flexible and hence able to deform mechanically around a sparse population of protruding interfacial impurities. We show that the air sensitive two dimensional (2D) crystal NbSe2 can be fabricated into heterostructures with pristine interfaces by processing in an inert-gas environment. Finally we find that adopting glove-box transfer significantly improves the quality of interfaces for WSe2 compared to processing in air.
Author(s): Rooney A, Kozikov A, Rudenko AN, Prestat E, Hamer M, Withers F, Cao Y, Novoselov KS, Katsnelson MI, Gorbachev R, Haigh S
Publication type: Article
Publication status: Published
Journal: Nano Letters
Year: 2017
Volume: 17
Issue: 9
Pages: 5222-5228
Print publication date: 13/09/2017
Online publication date: 25/07/2017
Acceptance date: 02/07/2017
ISSN (print): 1530-6984
ISSN (electronic): 1530-6992
Publisher: American Chemical Society
URL: https://doi.org/10.1021/acs.nanolett.7b01248
DOI: 10.1021/acs.nanolett.7b01248
Altmetrics provided by Altmetric