Browse by author
Lookup NU author(s): Dr Aleksey KozikovORCiD
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows investigating QPC conductance plateaus affected by the tip at these positions. We compensate the capacitive coupling of the tip to the QPC and discover that interference fringes coexist with distorted QPC plateaus. We spatially resolve the mode structure for each plateau.
Author(s): Kozikov AA, Steinacher R, Rössler C, Ihn T, Ensslin K, Reichl C, Wegscheider W
Publication type: Article
Publication status: Published
Journal: Nano Letters
Print publication date: 09/12/2015
Online publication date: 16/11/2015
Acceptance date: 10/11/2015
ISSN (print): 1530-6984
ISSN (electronic): 1530-6992
Publisher: American Chemical Society
Altmetrics provided by Altmetric