Toggle Main Menu Toggle Search

Open Access padlockePrints

Modeling Exposure to Multiple Childhood Social Risk Factors and Physical Capability and Common Affective Symptoms in Later Life

Lookup NU author(s): Professor Rachel CooperORCiD


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


© 2017, © The Author(s) 2017. Objective: This study presents three approaches, that is, cumulative risk, factor analysis, and latent class analysis, to summarize exposure to multiple childhood social risk factors and to compare their utility when examining associations with physical capability and common affective symptoms in adults aged 60 to 64 years. Methods: Data came from the U.K. Medical Research Council (MRC) National Survey of Health and Development, with prospective childhood social risk factor data collected in 1950 to 1957 and retrospectively in 1989. Physical capability and common affective symptom data were collected in 2006 to 2011. Results: The cumulative risk approach and factor analysis provided evidence that children who were exposed to multiple social risk factors had lower levels of physical capability and more symptoms of common affective symptoms in later life. Discussion: The cumulative social risk approach and the use of factor analysis to identify contexts of social risk, may offer viable methods for linking multiple childhood social risk exposure to aging outcomes.

Publication metadata

Author(s): Caleyachetty R, Hardy R, Cooper R, Richards M, Howe LD, Anderson E, Kuh D, Stafford M

Publication type: Article

Publication status: Published

Journal: Journal of Aging and Health

Year: 2018

Volume: 30

Issue: 3

Pages: 386-407

Print publication date: 01/03/2018

Online publication date: 22/12/2016

Acceptance date: 02/04/2016

Date deposited: 27/01/2022

ISSN (print): 0898-2643

ISSN (electronic): 1552-6887

Publisher: SAGE Publications Inc.


DOI: 10.1177/0898264316680434

PubMed id: 28553793


Altmetrics provided by Altmetric