Browse by author
Lookup NU author(s): Dr Kirsty ScottORCiD, Dr Lisa AlcockORCiD
This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).
© 2021 by the authors. Licensee MDPI, Basel, Switzerland.Optoelectronic stereophotogrammetric (SP) systems are widely used in human movement research for clinical diagnostics, interventional applications, and as a reference system for validating alternative technologies. Regardless of the application, SP systems exhibit different random and systematic errors depending on camera specifications, system setup and laboratory environment, which hinders comparing SP data between sessions and across different systems. While many methods have been proposed to quantify and report the errors of SP systems, they are rarely utilized due to their complexity and need for additional equipment. In response, an easy-to-use quality control (QC) check has been designed that can be completed immediately prior to a data collection. This QC check requires minimal training for the operator and no additional equipment. In addition, a custom graphical user interface ensures automatic processing of the errors in an easy-to-read format for immediate interpretation. On initial deployment in a multicentric study, the check (i) proved to be feasible to perform in a short timeframe with minimal burden to the operator, and (ii) quantified the level of random and systematic errors between sessions and systems, ensuring comparability of data in a variety of protocol setups, including repeated measures, longitudinal studies and multicentric studies.
Author(s): Scott K, Bonci T, Alcock L, Buckley E, Hansen C, Gazit E, Schwickert L, Cereatti A, Mazza C
Publication type: Article
Publication status: Published
Journal: Sensors
Year: 2021
Volume: 21
Issue: 24
Online publication date: 09/12/2021
Acceptance date: 07/12/2021
Date deposited: 13/01/2022
ISSN (electronic): 1424-8220
Publisher: MDPI
URL: https://doi.org/10.3390/s21248223
DOI: 10.3390/s21248223
Altmetrics provided by Altmetric