Browse by author
Lookup NU author(s): Dr Farhad Merchant
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
As the dimensions and operating voltages of computer electronics shrink to cope with consumers' demand for higher performance and lower power consumption, circuit sensitivity to soft errors increases dramatically. Recently, a new data-type is proposed in the literature called posit data type. Posit arithmetic has absolute advantages such as higher numerical accuracy, speed, and simpler hardware design than IEEE 754-2008 technical standard-compliant arithmetic. In this paper, we propose a comparative robustness study between 32-bit posit and 32-bit IEEE 754-2008 compliant representations. At first, we propose a theoretical analysis for IEEE 754 compliant numbers and posit numbers for single bit flip and double bit flips. Then, we conduct exhaustive fault injection experiments that show a considerable inherent resilience in posit format compared to classical IEEE 754 compliant representation. To show a relevant use-case of fault-tolerant applications, we perform experiments on a set of machine-learning applications. In more than 95% of the exhaustive fault injection exploration, posit representation is less impacted by faults than the IEEE 754 compliant floating-point representation. Moreover, in 100% of the tested machine-learning applications, the accuracy of posit-implemented systems is higher than the classical floating-point-based ones.
Author(s): Alouani I, Khalifa A, Merchant F, Leupers R
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID 2021)
Year of Conference: 2021
Online publication date: 26/04/2021
Acceptance date: 20/02/2021
ISSN: 2380-6923
Publisher: IEEE
URL: https://doi.org/10.1109/VLSID51830.2021.00052
DOI: 10.1109/VLSID51830.2021.00052
Library holdings: Search Newcastle University Library for this item
ISBN: 9781665440875