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A Rapid Reset 8-Transistor Physically Unclonable Function Utilising Power Gating

Lookup NU author(s): Yujin ZhengORCiD, Dr Alex Bystrov, Professor Alex Yakovlev


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Physically Unclonable Functions (PUFs) need error correction whilst regenerating Secret Keys in cryptography. The proposed 8-Transistor (8T) PUF, which coordinates with the power gating technique, can significantly accelerate a single evaluation cycle 1000 times faster than 6T-SRAM PUF does with a 12.8% area increase. This design enables multiple evaluations even in the key regeneration phase in the field, hence greatly reducing the number of errors and the hardware penalty for error correction. The 8T PUF is derived from the 6T SRAM. It is built to eliminate data retention swiftly and maximise physical mismatches. And a two-phase power gating module is designed to provide controllable power-on/off cycles rapidly for the chosen PUF clusters in order to facilitate statistical measurements and curb the in-rush current, thereby enhancing PUF entropy and security. An architecture of the power-gated PUF is developed to accommodate fast multiple evaluations. Post-layout Monte Carlo simulations were performed with Cadence, and the extracted PUF Responses were processed with Matlab to evaluate the 8T PUF performance and statistical metrics for subsequent inclusion into PUF Responses.

Publication metadata

Author(s): Zheng Y, Bystrov A, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 2023 Design, Automation & Test in Europe Conference (DATE 2023)

Year of Conference: 2023

Online publication date: 02/06/2023

Acceptance date: 17/11/2022

ISSN: 1530-1591

Publisher: IEEE


DOI: 10.23919/DATE56975.2023.10136995

Library holdings: Search Newcastle University Library for this item

ISBN: 9783981926378