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Lookup NU author(s): Professor Gui Yun TianORCiD
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© 2023 IOP Publishing LtdDirect interfacing technique (DIT) eradicates additional circuit requirements for sensor-embedded system interface and digitization of analog signals. This technique provides advantages in designing an efficient, portable, and low-cost sensor system. Pulsed eddy current testing (PECT) systems are used for thickness and defect measurements of conductive materials. Circuitous sensor-interfacing methods and tedious data interpretation processes make PECT systems inapt for miniaturization and portable applications. In this work, DIT is used in conjunction with PECT for thickness estimation of conductive material. Change in the de-energizing time of a single coil probe with sample thickness, with respect to air, is used as a signal. The curve fitting method yields a maximum relative error of ≈2% in the thickness estimation. Effects of temperature and liftoff on system accuracy are also investigated. A liftoff compensation method using a 3-signal data group is proposed. It is shown that for thicknesses in the range of 0.508 mm-3.175 mm and liftoffs up to 3.000 mm (step size: 0.500 mm), the proposed scheme produces a maximum relative error of 5.2%. The DIT and PECT combination can be applied for different structural eddy current testing in the future.
Author(s): Ali A, Asif A, Tian GY, Aziz F, Ul Abdin MZ
Publication type: Article
Publication status: Published
Journal: Measurement Science and Technology
Year: 2023
Volume: 34
Issue: 12
Print publication date: 01/12/2023
Online publication date: 21/08/2023
Acceptance date: 02/04/2023
ISSN (print): 0957-0233
ISSN (electronic): 1361-6501
Publisher: Institute of Physics
URL: https://doi.org/10.1088/1361-6501/ace989
DOI: 10.1088/1361-6501/ace989
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