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Graph embedding-based Bayesian network for fault isolation in complex equipment

Lookup NU author(s): Dr Manuel HerreraORCiD

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This work is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0).

Publication metadata

Author(s): Xia L, Zheng P, Herrera M, Liang Y, Li X, Gao L

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Reliability

Year: 2024

Pages: epub ahead of print

Online publication date: 09/07/2024

Acceptance date: 03/07/2024

Date deposited: 24/09/2024

ISSN (print): 0018-9529

ISSN (electronic): 1558-1721

Publisher: IEEE

URL: https://doi.org/10.1109/TR.2024.3416064

DOI: 10.1109/TR.2024.3416064

ePrints DOI: 10.57711/bhv5-e714

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Funding

Funder referenceFunder name
10.13039/501100004377-Hong Kong Polytechnic University (Grant Number: 1-BBR2)
10.13039/501100007162-Guangdong Provincial Department of Science and Technology (Grant Number: 2023A1515011557)
Shanghai Science and Technology (Grant Number: 22010500900)
State Key Laboratory of Ultra-precision Machining Technology

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