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FedFly: Toward Migration in Edge-Based Distributed Federated Learning

Lookup NU author(s): Dr Rehmat UllahORCiD

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This is the authors' accepted manuscript of an article that has been published in its final definitive form by IEEE, 2022.

For re-use rights please refer to the publisher's terms and conditions.


Abstract

Federated learning (FL) is a privacy-preserving distributed machine learning technique that trains models while keeping all the original data generated on devices locally. Since devices may be resource-constrained, offloading can be used to improve FL performance by transferring computational workload from devices to edge servers. However, due to mobility, devices participating in FL may leave the network during training and need to connect to a different edge server. This is challenging because the offloaded computations from an edge server need to be migrated. In line with this assertion, we present FedFly, which is, to the best of our knowledge, the first work to migrate a deep neural network (ONN) when devices move between edge servers during FL training. Our empirical results on the CIFAR-10 dataset, with both balanced and imbalanced data distribution, support our claims that FedFly can reduce training time by up to 33 percent when a device moves after 50 percent of the training is completed, and by up to 45 percent when 90 percent of the training is completed when compared to the state-of-the-art offloading approach in FL. FedFly has negligible overhead of up to two seconds and does not compromise accuracy. Finally, we highlight a number of open research issues for further investigation.


Publication metadata

Author(s): Ullah R, Wu D, Harvey P, Kilpatrick P, Spence I, Varghese B

Publication type: Article

Publication status: Published

Journal: IEEE Communications Magazine

Year: 2022

Volume: 60

Issue: 11

Pages: 42-48

Print publication date: 01/11/2022

Online publication date: 01/08/2022

Acceptance date: 18/07/2022

Date deposited: 11/02/2025

ISSN (print): 0163-6804

ISSN (electronic): 1558-1896

Publisher: IEEE

URL: https://doi.org/10.1109/MCOM.003.2100964

DOI: 10.1109/MCOM.003.2100964

ePrints DOI: 10.57711/1w7j-cw94


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