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Charge carrier induced lattice strain and stress effects on As activation in Si

Lookup NU author(s): Dr Chihak Ahn

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Author(s): Ahn C, Dunham ST

Publication type: Article

Publication status: Published

Journal: Applied Physics Letters

Year: 2008

Volume: 93

Print publication date: 01/01/2008

ISSN (print): 0003-6951

ISSN (electronic): 1077-3118

Publisher: American Institute of Physics

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