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Barrier height determination of SiC Schottky diodes by capacitance and current-voltage measurements

Lookup NU author(s): Dr Christopher Johnson, Professor Nick Wright

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Author(s): Raynaud C, Isoird K, Lazar M, Johnson CM, Wright N

Publication type: Article

Publication status: Published

Journal: Journal of Applied Physics

Year: 2002

Volume: 91

Issue: 12

Pages: 9841-

ISSN (print): 0021-8979

ISSN (electronic): 1520-8850

Publisher: American Institute of Physics

URL: http://dx.doi.org/10.1063/1.1477256

DOI: 10.1063/1.1477256

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