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Estimation and control of power electronic device temperature during operation with variable conducting current

Lookup NU author(s): Mahera Musallam, Professor Paul Acarnley, Dr Christopher Johnson, Dr Len Pritchard, Professor Volker Pickert

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Abstract

Frequent variations in device power loss cause corresponding changes in operating temperature, which may adversely affect device reliability. A method for reducing the device temperature variations is introduced. A simplified third-order thermal model of the device is evaluated in real-time to estimate the instantaneous device temperature. The estimated temperature is used in a temperature control loop to reduce temperature variations by adjusting the device switching frequency. In this way, changes in device conduction loss are counteracted by varying the switching losses, so that the overall losses are substantially constant. The principle is applied to a MOSFET switching a dc load current at random intervals. © The Institution of Engineering and Technology 2007.

Publication metadata

Author(s): Musallam M, Acarnley PP, Johnson CM, Pritchard L, Pickert V

Publication type: Article

Publication status: Published

Journal: IET Circuits, Devices and Systems

Year: 2007

Volume: 1

Issue: 2

Pages: 111-116

ISSN (print): 1751-858X

ISSN (electronic):

Publisher: The Institution of Engineering and Technology

URL: http://dx.doi.org/10.1049/iet-cds:20060066

DOI: 10.1049/iet-cds:20060066

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