Browse by author
Lookup NU author(s): Mahera Musallam,
Professor Paul Acarnley,
Dr Christopher Johnson,
Dr Len Pritchard,
Professor Volker Pickert
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
Frequent variations in device power loss cause corresponding changes in operating temperature, which may adversely affect device reliability. A method for reducing the device temperature variations is introduced. A simplified third-order thermal model of the device is evaluated in real-time to estimate the instantaneous device temperature. The estimated temperature is used in a temperature control loop to reduce temperature variations by adjusting the device switching frequency. In this way, changes in device conduction loss are counteracted by varying the switching losses, so that the overall losses are substantially constant. The principle is applied to a MOSFET switching a dc load current at random intervals. © The Institution of Engineering and Technology 2007.
Author(s): Musallam M, Acarnley PP, Johnson CM, Pritchard L, Pickert V
Publication type: Article
Publication status: Published
Journal: IET Circuits, Devices and Systems
ISSN (print): 1751-858X
Publisher: The Institution of Engineering and Technology
Altmetrics provided by Altmetric