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CDW photogrammetry of low relief fluvial features: Accuracy and implications for reach-scale sediment budgeting

Lookup NU author(s): M Charlton, Dr David Passmore


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Terrestrial photogrammetry enables rapid survey to be undertaken in the fluvial environment, a crucial factor when assessing highly dynamic features. In addition, it permits the generation of terrain surfaces at a level of detail which, given equal time constraints in the field, far exceeds the detail permitted by conventional tacheometric survey. This study details the levels of accuracy that can be achieved using the RolleiMetric Close-range Digital Workstation (CDW) photogrammetric survey technique on a variety of low relief fluvial geomorphic features (lateral, point and mid-channel bars) ranging from 10 m(2) to 100 m(2). The CDW software processes image data from an array of photographs and establishes a set of three-dimensional co-ordinates for the photographed object. The accuracies achieved across all bar surfaces were well within the resolution defined by the maximum size of the gravel on the bar surface (mean errors were between 0.026 and 0.057 m). The use of CDW photogrammetry does not require experienced personnel; however, care must be taken during the survey to minimize edge effects and to ensure that target density is sufficient to produce a terrain model that is accurate to within the limits of the surface sediment size. Guidance on target density as a function of terrain roughness is given to aid the user. A methodology is suggested that will allow CDW to be incorporated into sediment budgeting techniques, improving the level of achievable accuracy. (C) 1998 John Wiley & Sons, Ltd.

Publication metadata

Author(s): Heritage GL, Fuller IC, Charlton ME, Brewer PA, Passmore DG

Publication type: Article

Publication status: Published

Journal: Earth Surface Processes and Landforms

Year: 1998

Volume: 23

Issue: 13

Pages: 1219-1233

Print publication date: 11/02/1999

ISSN (print): 0197-9337

ISSN (electronic): 1096-9837


DOI: 10.1002/(SICI)1096-9837(199812)23:13<1219::AID-ESP927>3.0.CO;2-R

Notes: Special Issue: Technical & Software Bulletin 1998


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