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Fundamental physics of strained layer GeSi: Quo vadis?

Lookup NU author(s): Dr Michael Shaw, Professor Milan Jaros


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Publication metadata

Author(s): Shaw MJ, Jaros M

Editor(s): Hull, R., Bean, J.C., Willardson, R.K., Weber, E.R.

Publication type: Book Chapter

Publication status: Published

Book Title: Germanium Silicon: Physics and Materials

Year: 1999

Volume: 56

Pages: 169-223

Print publication date: 01/01/1999

Series Title: Semiconductors and Semimetals

Publisher: Academic Press

Place Published: London, UK


DOI: 10.1016/S0080-8784(08)62582-X

Library holdings: Search Newcastle University Library for this item

ISBN: 9780127521640